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ADN2850BCPZ250 Arkusz danych(PDF) 1 Page - Analog Devices |
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ADN2850BCPZ250 Arkusz danych(HTML) 1 Page - Analog Devices |
1 / 28 page Nonvolatile Memory, Dual 1024-Position Digital Resistor Data Sheet ADN2850 Rev. E Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibilityisassumedbyAnalogDevicesforitsuse,norforanyinfringementsofpatentsorother rightsofthirdpartiesthatmayresultfromitsuse.Specificationssubjecttochangewithoutnotice.No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2004–2012 Analog Devices, Inc. All rights reserved. FEATURES Dual-channel, 1024-position resolution 25 kΩ, 250 kΩ nominal resistance Maximum ±8% nominal resistor tolerance error Low temperature coefficient: 35 ppm/°C 2.7 V to 5 V single supply or ±2.5 V dual supply Current monitoring configurable function SPI-compatible serial interface Nonvolatile memory stores wiper settings Power-on refreshed with EEMEM settings Permanent memory write protection Resistance tolerance stored in EEMEM 26 bytes extra nonvolatile memory for user-defined information 1M programming cycles 100-year typical data retention APPLICATIONS SONET, SDH, ATM, Gigabit Ethernet, DWDM laser diode driver, optical supervisory systems Mechanical rheostat replacement Instrumentation gain adjustment Programmable filters, delays, time constants Sensor calibration GENERAL DESCRIPTION The ADN2850 is a dual-channel, nonvolatile memory1, digitally controlled resistors2 with 1024-step resolution, offering guaranteed maximum low resistor tolerance error of ±8%. The device performs the same electronic adjustment function as a mechanical rheostat with enhanced resolution, solid state reliability, and superior low temperature coefficient performance. The versatile programming of the ADN2850 via an SPI®-compatible serial interface allows 16 modes of operation and adjustment including scratchpad programming, memory storing and restoring, increment/decrement, ±6 dB/step log taper adjustment, wiper setting readback, and extra EEMEM1 for user-defined information such as memory data for other components, look-up table, or system identification information. FUNCTIONAL BLOCK DIAGRAM ADDR DECODE ADN2850 RDAC1 SERIAL INTERFACE CS CLK SDI SDO PR WP RDY RDAC1 REGISTER EEMEM1 CURRENT MONITOR EEMEM2 26 BYTES RTOL* USER EEMEM POWER-ON RESET W1 B1 RDAC2 W2 B2 VDD V1 V2 EEMEM CONTROL *RWB FULL SCALE TOLERANCE. VSS GND RDAC1 REGISTER I1 I2 Figure 1. In the scratchpad programming mode, a specific setting can be programmed directly to the RDAC2 register, which sets the resistance between Terminal W and Terminal B. This setting can be stored into the EEMEM and is restored automatically to the RDAC register during system power-on. The EEMEM content can be restored dynamically or through external EE AA strobing, and a AA WPEE AA function protects EEMEM contents. To simplify the programming, the independent or simultaneous linear-step increment or decrement commands can be used to move the RDAC wiper up or down, one step at a time. For logarithmic ±6 dB changes in the wiper setting, the left or right bit shift command can be used to double or halve the RDAC wiper setting. PR The ADN2850 patterned resistance tolerance is stored in the EEMEM. The actual full scale resistance can, therefore, be known by the host processor in readback mode. The host can execute the appropriate resistance step through a software routine that simplifies open-loop applications as well as precision calibration and tolerance matching applications. The ADN2850 is available in the 5 mm × 5 mm 16-lead frame chip scale LFCSP and thin, 16-lead TSSOP package. The part is guaranteed to operate over the extended industrial temperature range of −40°C to +85°C. 1 The terms nonvolatile memory and EEMEM are used interchangeably. 2 The terms digital resistor and RDAC are used interchangeably. |
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