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ADIS16201 Arkusz danych(PDF) 4 Page - Analog Devices

Numer części ADIS16201
Szczegółowy opis  Programmable Dual-Axis Inclinometer/Accelerometer
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ADIS16201
Data Sheet
Rev. C | Page 4 of 32
Parameter
Conditions
Min
Typ
Max
Unit
DAC OUTPUT
5 kΩ/100 pF to GND
Resolution
12
Bits
Relative Accuracy
For Code 101 to Code 4095
4
LSB
Differential Nonlinearity
1
LSB
Offset Error
±5
mV
Gain Error
±0.5
%
Output Range
0 to 2.5
V
Output Impedance
2
Output Settling Time
10
µs
LOGIC INPUTS
Input High Voltage, VINH
2.0
V
Input Low Voltage, VINL
0.8
V
Logic 1 Input Current, IINH
VIH = VDD
±0.2
±1
µA
Logic 0 Input Current, IINL
VIL = 0 V
−40
−60
μA
Input Capacitance, CIN
10
pF
DIGITAL OUTPUTS
Output High Voltage, VOH
ISOURCE = 1.6 mA
2.4
V
Output Low Voltage, VOL
ISINK = 1.6 mA
0.4
V
SLEEP TIMER
Timeout Period3
0.5
128
Seconds
FLASH MEMORY
Endurance4
20,000
Cycles
Data Retention5
TJ = 85°C
20
Years
CONVERSION RATE
Minimum Conversion Time
244
μs
Maximum Conversion Time
484
ms
Maximum Throughput Rate
4096
SPS
Minimum Throughput Rate
2.066
SPS
POWER SUPPLY
Operating Voltage Range VDD
3.0
3.3
3.6
V
Power Supply Current
Normal mode, SMPL_TIME ≥
0x08 (fs ≤ 910 Hz), at 25°C
11
14
mA
Fast mode, SMPL_TIME ≤ 0x07
(fs ≥ 1024 Hz), at 25°C
36
42
mA
Sleep mode, at 25°C
500
750
µA
Turn-On Time6
130
ms
1
Guaranteed by iMEMs packaged part testing, design, and/or characterization.
2
Self-test response changes as the square of VDD.
3
Guaranteed by design.
4
Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
5
Retention lifetime equivalent at junction temperature (TJ) 85°C as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.
6
The start-up time defines the time from VDD > 3.0 V to the first output register update. This parameter does not account for filter settling, which depends on the
SMPL_PRD and AVG_CNT settings.


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