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LM1971MX Arkusz danych(PDF) 3 Page - Texas Instruments |
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LM1971MX Arkusz danych(HTML) 3 Page - Texas Instruments |
3 / 19 page LM1971 www.ti.com SNAS104B – FEBRUARY 1995 – REVISED APRIL 2013 Electrical Characteristics (1) (2) The following specifications apply for VDD = +12V (VREFIN = +6V), VIN = 5.5 Vpk, and f = 1 kHz, unless otherwse specified. Limits apply for TA = 25°C. Digital inputs are TTL and CMOS compatible. LM1971 Units Symbol Parameter Conditions (Limits) Typical(3) Limit(4) IS Supply Current Digital Inputs Tied to 6V 1.8 3 mA (max) THD Total Harmonic Distortion VIN = 0.5Vpk@ 0 dB Attenuation 0.0008 0.003 % (max) eIN Noise Input is AC Grounded @ −12 dB 4.0 μV Attenuation A-Weighted(5) DR Dynamic Range Referenced to Full Scale = +6 Vpk 115 dB AM Mute Attenuation 102 96 dB (min) Attenuation Step Size Error 0 dB to −62 dB 0.009 0.2 dB (max) Absolute Attenuation Attenuation @ 0 dB 0.1 0.5 dB (min) Attenuation @ −20 dB −20.3 −19.0 dB (min) Attenuation @ −40 dB −40.5 −38.0 dB (min) Attenuation @ −60 dB −60.6 −57.0 dB (min) Attenuation @ −62 dB −62.6 −59.0 dB (min) ILEAK Analog Input Leakage Current Input is AC Grounded 5.8 100 nA (max) Frequency Response 20 Hz–100 kHz ±0.1 dB RIN AC Input Impedance Pin 8, VIN = 1.0 Vpk, f = 1 kHz 40 20 k Ω (min) 60 k Ω (max) IIN Input Current @ Pins 4, 5, 6 @ 0V < VIN < 5V 1.0 100 nA (max) fCLK Clock Frequency 3 2 MHz (max) VIH High-Level Input Voltage @ Pins 4, 5, 6 2.0 V (min) VIL Low-Level Input Voltage @ Pins 4, 5, 6 0.8 V (max) (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not specify specific performance limits. Electrical Characteristics state DC and AC electrical specifications under particular test conditions which ensure specific performance limits. This assumes that the device is within the Operating Ratings. Specifications are not ensured for parameters where no limit is given, however, the typical value is a good indication of device performance. (2) All voltages are measured with respect to the GND pin (pin 3), unless otherwise specified. (3) Typicals are measured at 25°C and represent the parametric norm. (4) Limits are specifications that all parts are tested in production to meet the stated values. (5) Due to production test limitations, there is no limit for the Noise test. Please refer to Figure 5 and Figure 8 in Typical Performance Characteristics. Copyright © 1995–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LM1971 |
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