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KA7912TU Arkusz danych(PDF) 2 Page - Fairchild Semiconductor |
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KA7912TU Arkusz danych(HTML) 2 Page - Fairchild Semiconductor |
2 / 18 page © 2002 Fairchild Semiconductor Corporation www.fairchildsemi.com KA79XX / KA79XXA / LM79XX Rev. 1.1.0 2 Block Diagram Figure 1. Block Diagram Absolute Maximum Ratings Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera- ble above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi- tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. Values are at TA = 25°C unless otherwise noted. Notes: 1. Thermal resistance test board, size: 76.2 mm x 114.3 mm x 1.6 mm(1S0P), JEDEC standard: JESD51-3, JESD51-7. 2. Assume no ambient airflow. Symbol Parameter Value Unit VI Input Voltage -35 V RθJC Thermal Resistance, Junction-Case(1) 5 °C/W RθJA Thermal Resistance, Junction-Air(1, 2) 65 °C/W TOPR Operating Temperature Range 0 to +125 °C TSTG Storage Temperature Range - 65 to +150 °C VOLTAGE REFERENCE + - PROTECTION CIRCUITRY R1 R2 Rsc GND I1 I2 Out In Q1 Q2 Output Input |
Podobny numer części - KA7912TU |
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Podobny opis - KA7912TU |
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