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AD7652 Arkusz danych(PDF) 7 Page - Analog Devices |
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AD7652 Arkusz danych(HTML) 7 Page - Analog Devices |
7 / 24 page REV. E AD7664 –7– Pin No. Mnemonic Type Description 35 CNVST DI Start Conversion. A falling edge on CNVST puts the internal sample-and-hold into the hold state and initiates a conversion. In Impulse Mode (IMPULSE HIGH and WARP LOW), if CNVST is held LOW when the acquisition phase (t 8) is complete, the internal sample-and-hold is put into the hold state and a conversion is immediately started. 36 AGND P Must Be Tied to Analog Ground. 37 REF AI Reference Input Voltage. 38 REFGND AI Reference Input Analog Ground. 39 INGND AI Analog Input Ground. 43 IN AI Primary Analog Input with a Range of 0 V to VREF. NOTES AI = Analog Input DI = Digital Input DI/O = Bidirectional Digital DO = Digital Output P = Power DEFINITION OF SPECIFICATIONS Integral Nonlinearity Error (INL) Linearity error refers to the deviation of each individual code from a line drawn from negative full scale through positive full scale. The point used as negative full scale occurs 1/2 LSB before the first code transition. Positive full scale is defined as a level 1 1/2 LSB beyond the last code transition. The deviation is measured from the middle of each code to the true straight line. Differential Nonlinearity Error (DNL) In an ideal ADC, code transitions are 1 LSB apart. Differential nonlinearity is the maximum deviation from this ideal value. It is often specified in terms of resolution for which no missing codes are guaranteed. Full-Scale Error The last transition (from 011 . . . 10 to 011 . . . 11 in twos complement coding) should occur for an analog voltage 1 1/2 LSB below the nominal full scale (2.49994278 V for the 0 V–2.5 V range). The full-scale error is the deviation of the actual level of the last transition from the ideal level. Unipolar Zero Error The first transition should occur at a level 1/2 LSB above analog ground (19.073 µV for the 0 V–2.5 V range). Unipolar zero error is the deviation of the actual transition from that point. Spurious-Free Dynamic Range (SFDR) The difference, in decibels (dB), between the rms amplitude of the input signal and the peak spurious signal. Effective Number of Bits (ENOB) ENOB is a measurement of the resolution with a sine wave input. It is related to S/(N+D) by the following formula: ENOB S N D dB =+ [] − () 176 6 02 .. and is expressed in bits. Total Harmonic Distortion (THD) THD is the ratio of the rms sum of the first five harmonic components to the rms value of a full-scale input signal and is expressed in decibels. Signal-to-Noise Ratio (SNR) SNR is the ratio of the rms value of the actual input signal to the rms sum of all other spectral components below the Nyquist frequency, excluding harmonics and dc. The value for SNR is expressed in decibels. Signal to (Noise + Distortion) Ratio (S/[N+D]) S/(N+D) is the ratio of the rms value of the actual input signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for S/(N+D) is expressed in decibels. Aperture Delay Aperture delay is a measure of the acquisition performance and is measured from the falling edge of the CNVST input to when the input signal is held for a conversion. Transient Response The time required for the AD7664 to achieve its rated accuracy after a full-scale step function is applied to its input. Overvoltage Recovery The time required for the ADC to recover to full accuracy after an analog input signal 150% of full-scale is reduced to 50% of the full-scale value. |
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