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ADS8887IDRCR Arkusz danych(PDF) 3 Page - Texas Instruments |
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ADS8887IDRCR Arkusz danych(HTML) 3 Page - Texas Instruments |
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3 / 44 page  ADS8887 www.ti.com SBAS613A – MAY 2013 – REVISED DECEMBER 2013 ELECTRICAL CHARACTERISTICS All minimum and maximum specifications are at TA = –40°C to +85°C, AVDD = 3 V, DVDD = 3 V, VREF = 5 V, VCM = VREF / 2 V, and fSAMPLE = 100 kSPS, unless otherwise noted. Typical specifications are at TA = +25°C, AVDD = 3 V, and DVDD = 3 V. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ANALOG INPUT Full-scale input span(1)(2) AINP – AINN –VREF VREF V AINP –0.1 VREF + 0.1 V Operating input range(1)(2) AINN –0.1 VREF + 0.1 V VCM Input common-mode range 0 VREF / 2 VREF V CI Input capacitance AINP and AINN terminal to GND 59 pF Input leakage current During acquisition for dc input 5 nA SYSTEM PERFORMANCE Resolution 18 Bits NMC No missing codes 18 Bits DNL Differential linearity –0.99 ±0.7 1.5 LSB(3) INL Integral linearity(4) –3 ±1.5 3 LSB(3) EO Offset error(5) –4 ±1 4 mV Offset error drift with temperature ±1.5 µV/°C EG Gain error –0.01 ±0.005 0.01 %FSR Gain error drift with temperature ±0.15 ppm/°C CMRR Common-mode rejection ratio With common-mode input signal = 5 VPP at dc 90 100 dB PSRR Power-supply rejection ratio At mid-code 80 dB Transition noise 0.7 LSB SAMPLING DYNAMICS tconv Conversion time 500 8800 ns tACQ Acquisition time 1200 ns Maximum throughput rate 100 kHz with or without latency Aperture delay 4 ns Aperture jitter, RMS 5 ps Step response Settling to 18-bit accuracy 1200 ns Overvoltage recovery Settling to 18-bit accuracy 1200 ns (1) Ideal input span, does not include gain or offset error. (2) Specified for VCM = VREF / 2. Refer to the Analog Input section for the effect of VCM on the full-scale input range. (3) LSB = least significant bit. (4) This parameter is the endpoint INL, not best-fit. (5) Measured relative to actual measured reference. Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: ADS8887 |
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