Document Number: 91087

www.vishay.com

S11-1052-Rev. D, 30-May-11

7

This document is subject to change without notice.

IRF9640S, SiHF9640S, IRF9640L, SiHF9640L

Vishay Siliconix

Fig. 14 - For P-Channel

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon

Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and

P.W.

Period

dI/dt

Diode recovery

dV/dt

Body diode forward drop

Body diode forward

current

Driver gate drive

Inductor current

D =

P.W.

Period

+

-

-

+

Peak Diode Recovery dV/dt Test Circuit

• dV/dt controlled by R

g

• D.U.T. - device under test

D.U.T.

Circuit layout considerations

• Low stray inductance

• Ground plane

• Low leakage inductance

current transformer

R

g

• Compliment N-Channel of D.U.T. for driver

V

DD

• I

Note

Note

a. V

V

a

D.U.T. l

D.U.T. V

V

DD

Re-applied

voltage

Ripple

≤ 5 %

I

SD

Reverse

recovery

current