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ADC12D040 Arkusz danych(PDF) 7 Page - Texas Instruments

Numer części ADC12D040
Szczegółowy opis  Dual 12-Bit, 40 MSPS, 600 mW A/D Converter with Internal/External Reference
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Strona internetowa  http://www.ti.com
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ADC12D040 Arkusz danych(HTML) 7 Page - Texas Instruments

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conversions.
ADC12D040
www.ti.com
SNAS171D – MAY 2004 – REVISED DECEMBER 2005
Converter Electrical Characteristics
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA VD +5V, VDR +3.0V, PD
= 0V, INT/EXT = VD, VREF = +2.0V,OEA, OEB = 0V, fCLK = 40 MHz, tr = tf = 3 ns, CL = 20 pF/pin. Boldface limits apply for TJ
= TMIN to TMAX: all other limits TJ = 25°C
(1) (2) (3)
Typical
Limits
Units
Symbol
Parameter
Conditions
(4)
(4)
(Limits)
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes
12
Bits (min)
INL
Integral Non Linearity (5)
±0.7
±2.0
LSB (max)
DNL
Differential Non Linearity
±0.4
±1.0
LSB (max)
Positive Error
0.51
+2.8/
−1.9
%FS
GE
Gain Error
Negative Error
0.68
+4/
−2.7
%FS
External Reference
15
ppm/ºC
TC GE
Gain Error Tempco
Internal Reference
100
ppm/ºC
VOFF
Offset Error (VIN+ = VIN−)
−0.1
±1.2
%FS (max)
External Reference
3
ppm/ºC
TC VOFF
Offset Error Tempco
Internal Reference
3
ppm/ºC
Under Range Output Code
0
0
Over Range Output Code
4095
4095
DYNAMIC CONVERTER CHARACTERISTICS
FPBW
Full Power Bandwidth
0 dBFS Input, Output at
−3 dB
100
MHz
fIN = 1 MHz, VIN = −0.5 dBFS
69
dB
SNR
Signal-to-Noise Ratio
fIN = 10 MHz, VIN = −0.5 dBFS
68
66.5
dB (min)
fIN = 1 MHz, VIN = −0.5 dBFS
69
dB
SINAD
Signal-to-Noise and Distortion
fIN = 10 MHz, VIN = −0.5 dBFS
68
65.6
dB (min)
fIN = 1 MHz, VIN = −0.5 dBFS
11.1
Bits
ENOB
Effective Number of Bits
fIN = 10 MHz, VIN = −0.5 dBFS
10.9
10.6
Bits (min)
fIN = 1 MHz, VIN = −0.5 dBFS
−80
dB
THD
Total Harmonic Distortion
fIN = 10 MHz, VIN = −0.5 dBFS
−78
−69
dB (max)
fIN = 1 MHz, VIN = −0.5 dBFS
−84
dB
H2
Second Harmonic
fIN = 10 MHz, VIN = −0.5 dBFS
−80
−73
dB (max)
fIN = 1 MHz, VIN = −0.5 dBFS
−84
dB
H3
Third Harmonic
fIN = 10 MHz, VIN = −0.5 dBFS
−82
−69.5
dB (max)
fIN = 1 MHz, VIN = −0.5 dBFS
84
dB
SFDR
Spurious Free Dynamic Range
fIN = 10 MHz, VIN = −0.5 dBFS
80
69.5
dB (min)
(1)
The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided
current is limited per (). However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100
mV. As an example, if VA is 4.75V, the full-scale input voltage must be ≤4.85V to ensure accurate
(2)
To guarantee accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin.
(3)
With the test condition for VREF = +2.0V (4VP-P differential input), the 12-bit LSB is 977 µV.
(4)
Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to National's AOQL
(Average Outgoing Quality Level).
(5)
Integral Non Linearity is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through
positive and negative full-scale.
Copyright © 2004–2005, Texas Instruments Incorporated
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