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ADC141S625 Arkusz danych(PDF) 6 Page - Texas Instruments

Numer części ADC141S625
Szczegółowy opis  14-Bit, 50 kSPS to 250 kSPS, Differential Input, Micro Power A/D Converter
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Producent  TI1 [Texas Instruments]
Strona internetowa  http://www.ti.com
Logo TI1 - Texas Instruments

ADC141S625 Arkusz danych(HTML) 6 Page - Texas Instruments

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DOUT
tf
tr
0.9 x VIO
0.1 x VIO
1.6V
TO OUTPUT
PIN
CL
25 pF
IOH
IOL
2 mA
2 mA
4
5
11
12
13
14
15
16
tACQ (Power-Down)
tCONV (Power-Up)
DB13 DB12
DB5
DB4
DB3
DB2
1
D`
SCLK
CS
2
3
17
18
0
0
0
1
DB1
DB0
2
tEN
tDIS
tCL
tCH
0
tCS
ADC141S625
SNAS434A – NOVEMBER 2007 – REVISED JANUARY 2009
www.ti.com
ADC141S626 Timing Specifications
(1)
The following specifications apply for VA = VIO = VREF= +2.7V to 5.5V and fSCLK = 0.9 to 4.5 MHz, CL = 25 pF, Boldface limits
apply for TA = TMIN to TMAX: all other limits TA = 25°C.
Symbol
Parameter
Conditions
Typical
Limits
Units
3
6
ns (min)
tCSS
CS Setup Time prior to an SCLK rising edge
1/fSCLK - 3
1/fSCLK - 6
ns (max)
tDH
DOUT Hold Time after an SCLK falling edge
10
6
ns (min)
tDA
DOUT Access Time after an SCLK falling edge
28
40
ns (max)
tDIS
DOUT Disable Time after the rising edge of CS
(2)
10
20
ns (max)
tCS
Minimum CS Pulse Width
5
20
ns (min)
tEN
DOUT Enable Time after the falling edge of CS
32
51
ns (max)
tCH
SCLK High Time
67
89
ns (min)
tCL
SCLK Low Time
67
89
ns (min)
tr
DOUT Rise Time
7
ns
tf
DOUT Fall Time
7
ns
(1)
Typical values are at TJ = 25°C and represent most likely parametric norms. Test limits are guaranteed to National's AOQL (Average
Outgoing Quality Level).
(2)
tDIS is the time for DOUT to change 10% while being loaded by the Timing Test Circuit.
Timing Diagrams
Figure 1. ADC141S626 Single Conversion Timing Diagram
Figure 2. Timing Test Circuit
Figure 3. DOUT Rise and Fall Times
6
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