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ADS1240 Arkusz danych(PDF) 2 Page - Texas Instruments |
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ADS1240 Arkusz danych(HTML) 2 Page - Texas Instruments |
2 / 31 page ADS1240, 1241 2 SBAS173F www.ti.com DIGITAL CHARACTERISTICS: –40 °C to +85°C, DV DD 2.7V to 5.25V PARAMETER CONDITIONS MIN TYP MAX UNITS Digital Input/Output Logic Family CMOS Logic Level: VIH 0.8 • DVDD DVDD V VIL DGND 0.2 • DVDD V VOH IOH = 1mA DVDD – 0.4 V VOL IOL = 1mA DGND DGND + 0.4 V Input Leakage: IIH VI = DVDD 10 µA IIL VI = 0 –10 µA Master Clock Rate: fOSC 15 MHz Master Clock Period: tOSC 1/fOSC 200 1000 ns AVDD to DGND ...................................................................... –0.3V to +6V DVDD to DGND ...................................................................... –0.3V to +6V Input Current ............................................................... 100mA, Momentary DGND to AGND .................................................................... –0.3V to 0.3V Input Current ................................................................. 10mA, Continuous AIN ................................................................. AGND –0.5V to AVDD + 0.5V Digital Input Voltage to DGND ................................. –0.3V to DVDD + 0.3V Digital Output Voltage to DGND .............................. –0.3V to DVDD + 0.3V Maximum Junction Temperature ................................................... +150 °C Operating Temperature Range ......................................... –40 °C to +85°C Storage Temperature Range .......................................... –60 °C to +150°C NOTE: (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. ABSOLUTE MAXIMUM RATINGS(1) ELECTROSTATIC DISCHARGE SENSITIVITY This integrated circuit can be damaged by ESD. Texas Instru- ments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. PACKAGE/ORDERING INFORMATION |
Podobny numer części - ADS1240_14 |
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Podobny opis - ADS1240_14 |
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