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MV12L25T-390 Arkusz danych(PDF) 4 Page - List of Unclassifed Manufacturers

Numer części MV12L25T-390
Szczegółowy opis  Multilayer Chip Varistor for Surge
Download  9 Pages
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MV12L25T-390 Arkusz danych(HTML) 4 Page - List of Unclassifed Manufacturers

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Multilayer Chip Varistor for Surge and
ESD Protection – L Type Series
Document No
TMVL-XXOS001D
Issued date
2014/04/18
Page
4/9
TA-I TECHNOLOGY CO., LTD
6. Reliability Test
Environmental
Specification
Test Method and Description
High Temperature
Storage/ Dry Heat
The specimen shall be subjected to 125 ± 2℃ for 1000 ± 12 hours in a
thermostatic bath without load and then stored at room temperature and
normal humidity for 1 to 2 hours. The change of varistor voltage shall be within
10 ﹪.
Temperature Cycle
The temperature cycle of specified
temperature shall be repeated five
times and then stored at room
temperature and normal humidity for
one or two hours. The change of
varistor voltage shall be within 10﹪
and mechanical damage shall be
examined.
Step
Temperature
Period
1
-40±3
30Min±3
2
Room
Temperature
1 hour
3
125±3
30Min±3
4
Room
Temperature
1 hours
High Temperature Load
After being continuously applied the maximum allowable voltage at 85 ± 2℃
for 1000± 2 hours, the specimen shall be stored at room temperature and
normal humidity for one or two hours, the change of varistor voltage shall be
within 10﹪.
Damp Heat Load
The specimen should be subjected to 40 ± 2℃, 90 to 95 ﹪RH environment,
and the maximum allowable voltage applied for 1000 hours, then stored at
room temperature and normal humidity for one or two hours. The change of
varistor voltage shall be within 10﹪
Humidity Load
Low Temperature
Storage/ Cold
The specimen should be subjected to -40 ± 2℃, without load for 500 hours
and then stored at room temperature for one or two hours. The change of
varistor voltage shall be within 10 ﹪


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