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HCPL-0601 Arkusz danych(PDF) 9 Page - Agilent(Hewlett-Packard) |
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HCPL-0601 Arkusz danych(HTML) 9 Page - Agilent(Hewlett-Packard) |
9 / 16 page 1-174 Package Characteristics All Typicals at TA = 25°C Parameter Sym. Package* Min. Typ. Max. Units Test Conditions Fig. Note Input-Output VISO 2500 V rms RH ≤ 50%, 5, 6 Momentary With- t = 1 min., stand Voltage** TA = 25°C Input-Output RI-O 1012 Ω VI-O = 500 Vdc 4, 8 Resistance Input-Output CI-O 0.6 pF f = 1 MHz, 4, 8 Capacitance TA = 25°C Input-Input II-I Dual Channel 0.005 µA RH ≤ 45%, 19 Insulation t = 5 s, Leakage Current VI-I = 500 V Resistance RI-I Dual Channel 1011 Ω 19 (Input-Input) Capacitance CI-I Dual 8-pin DIP 0.03 pF f = 1 MHz 19 Dual SO-8 0.25 *Ratings apply to all devices except otherwise noted in the Package column. **The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output continuous voltage rating. For the continuous voltage rating refer to the VDE 0884 Insulation Characteristics Table (if applicable), your equipment level safety specification or HP Application Note 1074 entitled “Optocoupler Input-Output Endurance Voltage.” †For 8-pin DIP package devices (HCPL-261A/261N/263A/263N) only. (Input-Input) OPT 020† 5000 5, 7 Notes: 1. Peaking circuits may be used which produce transient input currents up to 30 mA, 50 ns maximum pulse width, provided the average current does not exceed 10 mA. 2. 1 minute maximum. 3. Derate linearly above 80 °C free-air temperature at a rate of 2.7 mW/ °C for the SOIC-8 package. 4. Each channel. 5. Device considered a two-terminal device: Pins 1, 2, 3, and 4 shorted together and Pins 5, 6, 7, and 8 shorted together. 6. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 3000 V RMS for 1 second (leakage detection current limit, II-O ≤ 5 µA). This test is performed before the 100% production test for partial discharge (method b) shown in the VDE 0884 Insulation Characteristics Table, if applicable. 7. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 6000 V RMS for 1 second (leakage detection current limit, II-O ≤ 5 µA). 8. Measured between the LED anode and cathode shorted together and pins 5 through 8 shorted together. 9. The tPLH propagation delay is measured from the 1.75 mA point on the falling edge of the input pulse to the 1.5 V point on the rising edge of the output pulse. 10. The tPHL propagation delay is measured from the 1.75 mA point on the rising edge of the input pulse to the 1.5 V point on the falling edge of the output pulse. 11. Propagation delay skew (tPSK) is equal to the worst case difference in tPLH and/or tPHL that will be seen between any two units under the same test conditions and operating temperature. 12. Single channel products only (HCPL- 261A/261N/061A/061N). 13. Common mode transient immunity in a Logic High level is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will remain in a Logic High state (i.e., Vo > 2.0 V). 14. Common mode transient immunity in a Logic Low level is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will remain in a Logic Low state (i.e., VO < 0.8 V). 15. For sinusoidal voltages (|dVCM/dt|)max = πfCM VCM(P-P). 16. Bypassing of the power supply line is required with a 0.1 µF ceramic disc capacitor adjacent to each optocoup- ler as shown in Figure 19. Total lead length between both ends of the capacitor and the isolator pins should not exceed 10 mm. 17. Pulse Width Distortion (PWD) is defined as the difference between tPLH and tPHL for any given device. 18. No external pull up is required for a high logic state on the enable input of a single channel product. If the VE pin is not used, tying VE to VCC will result in improved CMR performance. 19. Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together. For dual channel parts only. |
Podobny numer części - HCPL-0601 |
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Podobny opis - HCPL-0601 |
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