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ADXRS614_15 Datasheet(Arkusz danych) 10 Page - Analog Devices

Numer części ADXRS614_15
Szczegółowy opis  50/s Yaw Rate Gyro
Pobierz  12 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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ADXRS614
Rev. A | Page 10 of 12
behavior. Typical ratiometricity error for null, sensitivity, self-
test, and temperature output is outlined in Table 3.
Note that VRATIO must never be greater than AVCC.
Table 3. Ratiometricity Error for Various Parameters
Parameter
VS = VRATIO = 4.75 V
VS = VRATIO = 5.25 V
ST1
Mean
−0.4%
−0.3%
Sigma
0.6%
0.6%
ST2
Mean
−0.4%
−0.3%
Sigma
0.6%
0.6%
Null
Mean
−0.04%
−0.02%
Sigma
0.3%
0.2%
Sensitivity
Mean
0.03%
0.1%
Sigma
0.1%
0.1%
VTEMP
Mean
−0.3%
−0.5%
Sigma
0.1%
0.1%
NULL ADJUSTMENT
The nominal 2.5 V null is for a symmetrical swing range at
RATEOUT (1B, 2A). However, a nonsymmetrical output swing
may be suitable in some applications. Null adjustment is
possible by injecting a suitable current to SUMJ (1C, 2C). Note
that supply disturbances may reflect some null instability.
Digital supply noise should be avoided particularly in this case.
SELF-TEST FUNCTION
The ADXRS614 includes a self-test feature that actuates each of
the sensing structures and associated electronics as if subjected
to angular rate. It is activated by standard logic high levels
applied to Input ST1 (5F, 5G), Input ST2 (4F, 4G), or both. ST1
causes the voltage at RATEOUT to change about −1.9 V, and
ST2 causes an opposite change of +1.9 V. The self-test response
follows the viscosity temperature dependence of the package
atmosphere, approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging.
ST1 and ST2 are fairly closely matched (±5%), but actuating
both simultaneously may result in a small apparent null bias
shift proportional to the degree of self-test mismatch.
ST1 and ST2 are activated by applying a voltage of greater than
0.8 × VRATIO to the ST1 and ST2 pins. ST1 and ST2 are
deactivated by applying a voltage of less than 0.2 × VRATIO to the
ST1 pin and the ST2 pin. The voltage applied to ST1 and ST2
must never be greater than AVCC.
CONTINUOUS SELF-TEST
The one-chip integration of the ADXRS614 gives it higher
reliability than is obtainable with any other high volume
manufacturing method. In addition, it is manufactured under a
mature BiMOS process with field-proven reliability. As an
additional failure detection measure, a power-on self-test can be
performed. However, some applications may warrant
continuous self-test while sensing rate. Details outlining
continuous self-test techniques are also available in a separate
application note.




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