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DAC38J82 Arkusz danych(PDF) 5 Page - Texas Instruments

Numer części DAC38J82
Szczegółowy opis  DAC3xJ82 Dual-Channel, 16-Bit, 1.6/2.5 GSPS, Digital-to-Analog Converters with 12.5 Gbps JESD204B Interface
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Producent  TI [Texas Instruments]
Strona internetowa  http://www.ti.com
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DAC38J82 Arkusz danych(HTML) 5 Page - Texas Instruments

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DAC37J82, DAC38J82
www.ti.com
SLASE16B – JANUARY 2014 – REVISED MAY 2014
Pin Functions (continued)
PIN
I/O
DESCRIPTION
NAME
NUMBER
CML SerDes interface lane 3 input, negative, expected to be AC coupled. It can be left open if
RX3N
M2
I
not used.
CML SerDes interface lane 4 input, positive, expected to be AC coupled. It can be left open if
RX4P
F1
I
not used.
CML SerDes interface lane 4 input, negative, expected to be AC coupled. It can be left open if
RX4N
E1
I
not used.
CML SerDes interface lane 5 input, positive, expected to be AC coupled. It can be left open if
RX5P
C1
I
not used.
CML SerDes interface lane 5 input, negative, expected to be AC coupled. It can be left open if
RX5N
D1
I
not used.
CML SerDes interface lane 6 input, positive, expected to be AC coupled. It can be left open if
RX6P
B1
I
not used.
CML SerDes interface lane 6 input, negative, expected to be AC coupled. It can be left open if
RX6N
A1
I
not used.
CML SerDes interface lane 7 input, positive, expected to be AC coupled. It can be left open if
RX7P
A3
I
not used.
CML SerDes interface lane 7 input, negative, expected to be AC coupled. It can be left open if
RX7N
A2
I
not used.
LVPECL SYSREF positive input with Vcm = 0.5V. This positive/negative pair is captured with
the rising edge of DACCLKP/N. It is used for JESD204B Subclass 1 deterministic latency and
SYSREFP
A7
I
multiple DAC synchronization, which can be periodic or pulsed. If not used, it is self-biased with
100mV differential at Vcm = 0.5V.
SYSREFN
A6
I
LVPECL SYSREF negative input with Vcm = 0.5V. (See the SYSREFP description)
SCLK
L9
I
Serial interface clock. Internal pull-down. It can be left open if not used.
Active low serial data enable, always an input to the DAC37J82/DAC38J82. Internal pull-up. It
SDENB
M9
I
can be left open if not used.
Serial interface data. Bi-directional in 3-pin mode (default) and 4-pin mode. Internal pull-down.
SDIO
L10
I/O
It can be left open if not used.
Uni-directional serial interface data in 4-pin mode. The SDO pin is tri-stated in 3-pin interface
SDO
M10
O
mode (default). It can be left open if not used.
Active high asynchronous hardware power-down input. Internal pull-down. It can be left open if
SLEEP
M8
I
not used.
SYNCBP
B7
O
Synchronization request to transmitter, LVDS positive output. It can be left open if not used.
SYNCBN
B6
O
Synchronization request to transmitter, LVDS negative output. It can be left open if not used.
Synchronization request to transmitter, CMOS output. Defaults to link 0, but can be
SYNC_N_AB
L6
O
programmable for any link. It can be left open if not used.
Synchronization request to transmitter, CMOS output. Defaults to link 1, but can be
SYNC_N_CD
L7
O
programmable for any link. It can be left open if not used.
TCLK
K4
I
JTAG test clock. It can be left open if not used.
TDI
L5
I
JTAG test data in. It can be left open if not used.
TDO
M5
O
JTAG test data out. It can be left open if not used.
TMS
L4
I
JTAG test mode select. It can be left open if not used.
JTAG test reset. Must be tied to GND to hold the JTAG state machine status reset if the JTAG
TRSTB
J3
I
port is not used.
To enable analog output data transmission, set sif_txenable in register config3 to “1” or pull
CMOS TXENABLE pin to high. Transmit enable active high input. Internal pull-down. To
TXENABLE
K5
I
disable analog output, set sif_txenable to “0” and pull CMOS TXENABLE pin to low. The DAC
output is forced to midscale. It can be left open if not used.
TESTMODE
K3
O
This pin is used for factory testing. Internal pull-down. It can be left open if not used.
D10, E10, H10,
VDDADAC33
I
Analog supply voltage. (3.3V)
J10,
VDDAPLL18
B10, B9
I
PLL analog supply voltage. (1.8V)
VDDAREF18
C10, K10
I
Analog reference supply voltage (1.8V)
Copyright © 2014, Texas Instruments Incorporated
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