STK672-401C-E

No.A2137-2/19

Specifications

Absolute Maximum Ratings at Tc = 25

°C

Parameter

Symbol

Conditions

Ratings

unit

Maximum supply voltage 1

VCC max

No signal

52

V

Maximum supply voltage 2

VDD max

No signal

-0.3 to +7.0

V

Input voltage

VIN max

Logic input pins

-0.3 to +5.8

V

Output current

IOH max

VDD=5V, CLOCK≥200Hz

2.2

A

Allowable power dissipation

Pd max

With an arbitrarily large heat sink. Per MOSFET

7

W

Operating substrate temperature

Tc max

105

°C

Junction temperature

Tj max

150

°C

Storage temperature

Tstg

-40 to +125

°C

Allowable Operating Ranges at Ta=25

°C

Parameter

Symbol

Conditions

Ratings

unit

Operating supply voltage 1

VCC

With signals applied

10 to 45

V

Operating supply voltage 2

VDD

With signals applied

5

±5%

V

Input high voltage

VIH

0 to 5.8

V

Output current

IOH

Tc=105

°C, CLOCK≥200Hz

2

A

Phase driver withstand voltage

VDSS

TR1, 2, 3, 4 ID=1mA (Tc=25°C)

100min

V

Electrical Characteristics at Tc=25

°C, VCC=24V, VDD=5.0V

Parameter

Symbol

Conditions

min

typ

max

unit

VDD supply current

ICCO

VDD=5.0V, ENABLE=Low Vref=2V

6

10

15

mA

Output average current

Ioave

R/L=3

Ω/3.8mH in each phase

0.51

0.59

0.66

A

FET diode forward voltage

Vdf

If=1A

1.2

1.6

V

Output saturation voltage

Vsat

RL=23Ω

0.5

0.7

V

VIH

Except for the Vref pin

2.5

V

Input voltage

VIL

Except for the Vref pin

0.6

V

Control

input pin

Input current

Iil

Except for the Vref pin

10

μA

Input voltage

VI

Pin 19

2

VDD

V

Vref pin

Input current

Ios

Pin 19, VDD input

12.5

μA

PWM frequency

fc

37.5

50

62.5

kHz

Current Distribution Ratio

2W1-2

W1-2

1-2

θ=7/8

100

2W1-2

W1-2

θ=6/8

93

2W1-2

θ=5/8

84

2W1-2

W1-2

1-2

θ=4/8

71

2W1-2

θ=3/8

55

2W1-2

W1-2

θ=2/8

40

2W1-2

θ=1/8

19

2

Vref

*1

100

%

Notes: A fixed-voltage power supply must be used.

The value of Item 1 is the design target and not measured.

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating

Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.