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DAC7563TDSCT Arkusz danych(PDF) 6 Page - Texas Instruments

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Numer części DAC7563TDSCT
Szczegółowy opis  Internal Reference
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Producent  TI1 [Texas Instruments]
Strona internetowa  http://www.ti.com
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DAC7562T, DAC7563T, DAC8162T
DAC8163T, DAC8562T, DAC8563T
SLASE61A – SEPTEMBER 2015 – REVISED OCTOBER 2015
www.ti.com
7.5 Electrical Characteristics
At AVDD = 2.7 V to 5.5 V and TA = –40°C to 125°C (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
STATIC PERFORMANCE(1)
Resolution
12
Bits
DAC756xT
Relative accuracy
Using line passing through codes 32 and 4,064
±0.3
±0.75
LSB
Differential nonlinearity
12-bit monotonic
±0.05
±0.25
Resolution
14
Bits
DAC816xT
Relative accuracy
Using line passing through codes 128 and 16,256
±1
±3
LSB
Differential nonlinearity
14-bit monotonic
±0.1
±0.5
Resolution
16
Bits
DAC856xT
Relative accuracy
Using line passing through codes 512 and 65,024
±4
±12
LSB
Differential nonlinearity
16-bit monotonic
±0.2
±1
Offset error
Extrapolated from two-point line(1), unloaded
±1
±4
mV
Offset error drift
±2
µV/°C
Full-scale error
DAC register loaded with all 1s, DAC output unloaded
±0.03
±0.2
% FSR
Zero-code error
DAC register loaded with all 0s, DAC output unloaded
1
4
mV
Zero-code error drift
±2
µV/°C
Gain error
Extrapolated from two-point line(1), unloaded
±0.01
±0.15
% FSR
ppm
Gain temperature coefficient
±1
FSR/°C
OUTPUT CHARACTERISTICS(2)
Output voltage range
0
AVDD
V
DACs unloaded
7
Output voltage settling time(3)
µs
RL = 1 MΩ
10
Slew rate
Measured between 20%–80% of a full-scale transition
0.75
V/µs
RL = ∞
1
Capacitive load stability
nF
RL = 2 kΩ
3
Code-change glitch impulse
1-LSB change around major carry
0.1
nV-s
Digital feedthrough
SCLK toggling, SYNC high
0.1
nV-s
Power-on glitch impulse
RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V
40
mV
Full-scale swing on adjacent channel,
5
External reference
Channel-to-channel dc crosstalk
µV
Full-scale swing on adjacent channel,
15
Internal reference
DC output impedance
At mid-scale input
5
Ω
DAC outputs at full-scale, DAC outputs shorted to
Short-circuit current
40
mA
GND
Power-up time, including settling time
Coming out of power-down mode
50
µs
AC PERFORMANCE(2)
DAC output noise density
TA = 25°C, at mid-scale input, fOUT = 1 kHz
90
nV/
√Hz
DAC output noise
TA = 25°C, at mid-scale input, 0.1 Hz to 10 Hz
2.6
µVPP
LOGIC INPUTS(2)
Input-pin leakage current
–1
±0.1
1
µA
Logic input LOW voltage VIL
0
0.8
V
Logic input HIGH voltage VIH
2.1
AVDD
V
Pin capacitance
3
pF
(1)
16-bit: codes 512 and 65,024; 14-bit: codes 128 and 16,256; 12-bit: codes 32 and 4,064, All digital inputs kept at same IO levels before
and after write to the DAC
(2)
Specification based on design or characterization
(3)
Transition time between 1 / 4 scale and 3 / 4 scale, including settling to within ±0.024% FSR
6
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Copyright © 2015, Texas Instruments Incorporated
Product Folder Links: DAC7562T DAC7563T DAC8162T DAC8163T DAC8562T DAC8563T


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