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ADXRS622WBBGZA Datasheet(Arkusz danych) 10 Page - Analog Devices

Numer części ADXRS622WBBGZA
Szczegółowy opis  plus,minus250temperature/sec Yaw Rate Gyroscope
Pobierz  12 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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ADXRS622
Rev. C | Page 10 of 12
ADXRS622 AND SUPPLY RATIOMETRICITY
The ADXRS622 RATEOUT and TEMP signals are ratiometric
to the VRATIO voltage, that is, the null voltage, rate sensitivity, and
temperature outputs are proportional to VRATIO. Therefore, the
ADXRS622 is most easily used with a supply-ratiometric analog-
to-digital converter (ADC) that results in self-cancellation of errors
due to minor supply variations.
There is some small error due to nonratiometric behavior. Typical
ratiometricity error for null, sensitivity, self-test, and temperature
output is outlined in Table 4.
Note that VRATIO must never be greater than AVCC.
Table 4. Ratiometricity Error for Various Parameters
Parameter
V
S = VRATIO = 4.85 V
V
S = VRATIO = 5.15 V
ST1
Mean
0.3%
0.09%
Sigma
0.21%
0.19%
ST2
Mean
−0.15%
−0.2%
Sigma
0.22%
0.2%
Null
Mean
−0.3%
−0.05%
Sigma
0.2%
0.08%
Sensitivity
Mean
0.003%
−0.25%
Sigma
0.06%
0.06%
V
TEMP
Mean
−0.2%
−0.04%
Sigma
0.05%
0.06%
NULL ADJUSTMENT
The nominal 2.5 V null is for a symmetrical swing range at
RATEOUT (1B, 2A). However, a nonsymmetric output swing
may be suitable in some applications. Null adjustment is possible
by injecting a suitable current to SUMJ (1C, 2C). Note that supply
disturbances may reflect some null instability. Digital supply noise
should be avoided, particularly in this case.
SELF-TEST FUNCTION
The ADXRS622 includes a self-test feature that actuates each of
the sensing structures and associated electronics as if subjected
to angular rate. It is activated by standard logic high levels applied
to Input ST1 (5F, 5G), Input ST2 (4F, 4G), or both. ST1 causes
the voltage at RATEOUT to change about −
0.5 V, and ST2 causes
an opposite change of +0.5 V. The self-test response follows the
viscosity temperature dependence of the package atmosphere,
approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging.
ST1 and ST2 are fairly closely matched (±5%), but actuating
both simultaneously may result in a small apparent null bias
shift proportional to the degree of self-test mismatch.
ST1 and ST2 are activated by applying a voltage equal to VRATIO
to the ST1 pin and the ST2 pin. The voltage applied to ST1 and
ST2 must never be greater than AVCC.
CONTINUOUS SELF-TEST
The on-chip integration of the ADXRS622 gives it higher reliability
than is obtainable with any other high volume manufacturing
method. In addition, it is manufactured under a mature BIMOS
process that has field-proven reliability. As an additional failure
detection measure, power-on self-test can be performed.
However, some applications may warrant continuous self-test
while sensing rate. Details outlining continuous self-test
techniques are also available in the AN-768 Application Note.




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