TLP2962

6

12.

12.

12.

12. Test Circuits and Characteristics Curves

Test Circuits and Characteristics Curves

Test Circuits and Characteristics Curves

Test Circuits and Characteristics Curves

12.1.

12.1.

12.1.

12.1. Test Circuits

Test Circuits

Test Circuits

Test Circuits

Fig.

Fig.

Fig.

Fig. 12.1.1

12.1.1

12.1.1

OH

OH

OH

Test Circuit

Test Circuit

Test Circuit

Test Circuit

Fig.

Fig.

Fig.

Fig. 12.1.2

12.1.2

12.1.2

12.1.2 V

V

V

OL

OL

OL

Test Circuit

Test Circuit

Test Circuit

Test Circuit

Fig.

Fig.

Fig.

Fig. 12.1.3

12.1.3

12.1.3

CCH

CCH

CCH

Test Circuit

Test Circuit

Test Circuit

Test Circuit

Fig.

Fig.

Fig.

Fig. 12.1.4

12.1.4

12.1.4

CCL

CCL

CCL

Test Circuit

Test Circuit

Test Circuit

Test Circuit

Fig.

Fig.

Fig.

Fig. 12.1.5

12.1.5

12.1.5

12.1.5 Switching Time Test Circuit and Waveform

Switching Time Test Circuit and Waveform

Switching Time Test Circuit and Waveform

Switching Time Test Circuit and Waveform

Fig.

Fig.

Fig.

Fig. 12.1.6

12.1.6

12.1.6

12.1.6 Common-Mode Transient Immunity Test Circuit and Waveform

Common-Mode Transient Immunity Test Circuit and Waveform

Common-Mode Transient Immunity Test Circuit and Waveform

Common-Mode Transient Immunity Test Circuit and Waveform

2015-10-28

Rev.3.0

©2015 Toshiba Corporation