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TLP293-4 Arkusz danych(PDF) 3 Page - Toshiba Semiconductor

Numer części TLP293-4
Szczegółowy opis  TOSHIBA PHOTOCOUPLER InGaAs IRED and PHOTO-TRANSISTOR
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Producent  TOSHIBA [Toshiba Semiconductor]
Strona internetowa  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TLP293-4 Arkusz danych(HTML) 3 Page - Toshiba Semiconductor

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TLP293-4
2015-10-21
3
Absolute Maximum Ratings (Note)(Unless otherwise specified, Ta = 25°C)
Characteristic
Symbol
Note
Rating
Unit
Input forward current
IF
50
mA
Input forward current derating (Ta
≥50°C)
∆IF /∆Ta
−0.59
mA /°C
Input forward current(Pulsed)
IFP
(Note 1)
1
A
Power dissipation
PD
70
mW
Power dissipation derating(Ta
≥50°C)
∆PD /∆Ta
-0.82
mW /°C
Input reverse voltage
VR
5
V
Junction temperature
Tj
125
°C
Collector-emitter voltage
VCEO
80
V
Emitter-collector voltage
VECO
7
V
Collector current
IC
50
mA
Collector power dissipation
(1 Circuit)
PC
100
mW
Collector power dissipation derating(Ta
≥25°C)
(1 Circuit)
∆PC /∆Ta
−0.91
mW /°C
Junction temperature
Tj
125
°C
Operating temperature range
Topr
−55 to 125
°C
Storage temperature range
Tstg
−55 to 125
°C
Lead soldering temperature
Tsol
260 (10s)
°C
Total power dissipation (1 Circuit)
PT
170
mW
Input power dissipation derating(Ta
≥25°C) (1 Circuit)
∆PT /∆Ta
−1.55
mW /°C
Isolation Voltage
AC, 60s, R.H.
≤60%
BVS
(Note 2)
3750
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note1: Pulse width
≤ 100 μs, frequency 100 Hz
Note2: This device is considered as a two-terminal device: All pins on the LED side are shorted together,
and all pin on the photodetector side are shorted together.
Electrical Characteristics (Unless otherwise specified, Ta = 25°C)
CHARACTERISTIC
SYMBOL
TEST CONDITION
MIN
TYP.
MAX
UNIT
Input forward voltage
VF
IF = 10 mA
1.1
1.25
1.4
V
Input reverse current
IR
VR = 5 V
10
μA
Input capacitance
CT
V = 0 V, f = 1 MHz
30
pF
Collector-emitter breakdown voltage
V(BR) CEO
IC = 0.5 mA
80
V
Emitter-collector breakdown voltage
V(BR) ECO
IE = 0.1 mA
7
V
Dark current
IDARK
VCE = 48 V,
0.01
0.08
μA
VCE = 48 V, Ta = 85°C
2
50
μA
Collector-emitter capacitance
CCE
V = 0 V, f = 1 MHz
10
pF


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