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X0405NF-1AA2 Arkusz danych(PDF) 4 Page - STMicroelectronics |
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X0405NF-1AA2 Arkusz danych(HTML) 4 Page - STMicroelectronics |
4 / 5 page X04 Series 4/5 Fig. 4: Relative variation of gate trigger current, holding current and latching current versus junction temperature (typical values). Fig. 5: Relative variation of holding current versus gate-cathode resistance (typical values). Fig. 6: Relative variation of dV/dt immunity versus gate-cathode resistance (typical values). Fig. 7: Relative variation of dV/dt immunity versus gate-cathode capacitance (typical values). Fig. 8: Surge peak on-state current versus number of cycles. Fig. 9: Non-repetitive surge peak on-state current for a sinusoidal pulse with width tp < 10 ms, and corresponding value of I²t. |
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