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ADC12010 Arkusz danych(PDF) 6 Page - Texas Instruments

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Numer części ADC12010
Szczegółowy opis  12-Bit, 10 MSPS, 160 mW A/D Converter with Internal Sample-and-Hold
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Strona internetowa  http://www.ti.com
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ADC12010
SNAS185B – APRIL 2003 – REVISED MARCH 2013
www.ti.com
CONVERTER ELECTRICAL CHARACTERISTICS
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +5V, VDR =
+3.0V, PD = 0V, VREF = +2.0V, fCLK = 10 MHz, tr = tf = 3 ns, CL = 25 pF/pin. Boldface limits apply for TA = TJ = TMIN to TMAX:
all other limits TA = TJ = 25°C
(1) (2) (3)
Units
Symbol
Parameter
Conditions
Typical (4)
Limits (4)
(Limits)
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes
12
Bits (min)
INL
Integral Non Linearity (5)
±0.5
±1.5
LSB (max)
DNL
Differential Non Linearity
±0.3
±0.9
LSB (max)
GE
Gain Error
±0.2
2.9
%FS (max)
Offset Error (VIN = VIN−)
−0.1
1.75
%FS (max)
Under Range Output Code
0
0
Over Range Output Code
4095
4095
DYNAMIC CONVERTER CHARACTERISTICS
FPBW
Full Power Bandwidth
0 dBFS Input, Output at
−3 dB
100
MHz
fIN = 1 MHz, VIN = −0.5 dBFS
70
dB
SNR
Signal-to-Noise Ratio
fIN = 4.4 MHz, VIN = −0.5 dBFS
70
dB
fIN = 10.1 MHz, VIN = −0.5 dBFS
70
66
dB (min)
fIN = 1 MHz, VIN = −0.5 dBFS
70
dB
SINAD
Signal-to-Noise and Distortion
fIN = 4.4 MHz, VIN = −0.5 dBFS
70
dB
fIN = 10.1 MHz, VIN = −0.5 dBFS
69
66
dB (min)
fIN = 1 MHz, VIN = −0.5 dBFS
11.4
dB
ENOB
Effective Number of Bits
fIN = 4.4 MHz, VIN = −0.5 dBFS
11.4
dB
fIN = 10.1 MHz, VIN = −0.5 dBFS
11.3
10.7
dB (min)
fIN = 1 MHz, VIN = −0.5 dBFS
−88
dB
THD
Total Harmonic Distortion
fIN = 4.4 MHz, VIN = −0.5 dBFS
−86
dB
fIN = 10.1 MHz, VIN = −0.5 dBFS
−79
−74
dB (min)
fIN = 1 MHz, VIN = −0.5 dBFS
92
dB
SFDR
Spurious Free Dynamic Range
fIN = 4.4 MHz, VIN = −0.5 dBFS
89
dB
fIN = 10.1 MHz, VIN = −0.5 dBFS
83
69
dB (min)
fIN = 4.7 MHz and 4.9 MHz, each = −7
IMD
Intermodulation Distortion
−75
dBFS
dBFS
REFERENCE AND ANALOG INPUT CHARACTERISTICS
VCM
Common Mode Input Voltage
VA / 2
V
(CLK LOW)
8
pF
CIN
VIN Input Capacitance (each pin to GND)
VIN = 2.5 Vdc + 0.7 Vrms
(CLK HIGH)
7
pF
1.0
V (min)
VREF
Reference Voltage (6)
2.00
2.4
V (max)
Reference Input Resistance
100
M
Ω(min)
(1)
The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided
current is limited per ABSOLUTE MAXIMUM RATINGS (3). However, errors in the A/D conversion can occur if the input goes above VA
or below GND by more than 100 mV. As an example, if VA is 4.75V, the full-scale input voltage must be ≤4.85V to ensure accurate
conversions.
(2)
To ensure accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin.
(3)
With the test condition for VREF = +2.0V (4VP-P differential input), the 12-bit LSB is 977 µV.
(4)
Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average
Outgoing Quality Level).
(5)
Integral Non Linearity is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through
positive and negative full-scale.
(6)
Optimum performance will be obtained by keeping the reference input in the 1.8V to 2.2V range. The LM4051CIM3-ADJ (SOT-23
package) is recommended for this application.
6
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