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ADS127L01IPBSR Arkusz danych(PDF) 5 Page - Texas Instruments |
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ADS127L01IPBSR Arkusz danych(HTML) 5 Page - Texas Instruments |
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5 / 86 page  5 ADS127L01 www.ti.com SBAS607A – APRIL 2016 – REVISED MAY 2016 Product Folder Links: ADS127L01 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Input pins are diode-clamped to the power-supply rails. Limit the input current to 10 mA or less if the analog input voltage exceeds VAVDD + 0.3 V or is less than VAGND – 0.3 V, or if the digital input voltage exceeds VDVDD + 0.3 V or is less than VDGND – 0.3 V. 6 Specifications 6.1 Absolute Maximum Ratings (1) MIN MAX UNIT Voltage AVDD to AGND –0.3 4.0 V DVDD to DGND –0.3 4.0 LVDD to AGND –0.3 2.0 AGND to DGND –0.3 0.3 REFP to AGND –0.3 AVDD + 0.3 REFN to AGND –0.3 AVDD + 0.3 Analog input AGND – 0.3 AVDD + 0.3 Digital input DGND – 0.3 DVDD + 0.3 Current Input, continuous, any pin except power supply pins (2) –10 10 mA Temperature Operating ambient, TA –40 125 °C Junction, TJ 150 Storage, Tstg –60 150 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±1000 |
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