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SN74LVC1G332DRLR Arkusz danych(PDF) 1 Page - Texas Instruments |
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SN74LVC1G332DRLR Arkusz danych(HTML) 1 Page - Texas Instruments |
1 / 26 page See mechanical drawings for dimensions. DBV PACKAGE (TOP VIEW) 2 GND V CC 5 3 4 B Y 6 1 A C DCK PACKAGE (TOP VIEW) 3 4 B 2 GND Y 5 1 A V CC 6 C DRY PACKAGE (TOP VIEW) GND V CC A 6 5 4 2 3 B Y C 1 YZP PACKAGE (BOTTOM VIEW) GND V CC A B 2 1 3 Y 5 4 6 C A B DSF PACKAGE (TOP VIEW) GND C Y V CC 6 5 4 2 3 1 Y + A ) B ) C or Y + A • B • C SN74LVC1G332 www.ti.com SCES489E – SEPTEMBER 2003 – REVISED DECEMBER 2013 Single 3-Input Positive-OR Gate Check for Samples: SN74LVC1G332 1 FEATURES DESCRIPTION The SN74LVC1G332 device performs the Boolean 2 • Available in the Texas Instruments NanoStar™ function in and NanoFree™ Packages positive logic. • Supports 5-V VCC Operation NanoStar™ and NanoFree™ package technology is • Inputs Accept Voltages to 5.5 V a major breakthrough in IC packaging concepts, • Supports Down Translation to VCC using the die as the package. • Max tpd of 4.5 ns at 3.3 V This device is fully specified for partial-power-down • Low Power Consumption, 10-µA Max ICC applications using Ioff. The Ioff circuitry disables the • ±24-mA Output Drive at 3.3 V outputs, preventing damaging current backflow through the device when it is powered down. • Ioff Supports Live Insertion, Partial-Power- Down Mode, and Back-Drive Protection • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 NanoStar, NanoFree are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Copyright © 2003–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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