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LM34DH Arkusz danych(PDF) 7 Page - Texas Instruments

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Numer części LM34DH
Szczegółowy opis  Precision Fahrenheit Temperature Sensors
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LM34
www.ti.com
SNIS161D – MARCH 2000 – REVISED JANUARY 2016
6.6 Electrical Characteristics: LM34, LM34C, and LM34D
Unless otherwise noted, these specifications apply:
−50°F ≤ TJ ≤ 300°F for the LM34 and LM34A; −40°F ≤ TJ ≤ 230°F for the
LM34C and LM34CA; and +32°F
≤ TJ ≤ 212°F for the LM34D. VS = 5 Vdc and ILOAD = 50 µA in the circuit of Full-Range
Fahrenheit Temperature Sensor; 6 Vdc for LM34 and LM34A for 230°F
≤ TJ ≤ 300°F. These specifications also apply from
5°F to TMAX in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F).
LM34
LM34C, LM34D
PARAMETER
CONDITIONS
UNIT
MIN
TYP
MAX
MIN
TYP
MAX
Tested Limit(2)
–2
2
–2
2
TA = 77°F
Design Limit(3)
°F
±0.8
±0.8
Tested Limit
TA = 0°F
Design Limit
–3
3
°F
±1
±1
Accuracy, LM34,
LM34C(1)
Tested Limit
–3
3
TA = TMAX
Design Limit
–3
3
°F
±1.6
±1.6
Tested Limit
TA = TMIN
Design Limit
–3
3
–4
4
°F
±1.6
±1.6
Tested Limit
–3
3
TA = 77°F
Design Limit
°F
±1.2
Tested Limit
Accuracy, LM34D(1)
TA = TMAX
Design Limit
–4
4
°F
±1.8
Tested Limit
TA = TMIN
Design Limit
–4
4
°F
±1.8
Tested Limit
Nonlinearity (4)
Design Limit
–1.0
1
–1
1
°F
±0.6
±0.4
Tested Limit
9.8
10.2
Sensor gain (Average
Design Limit
9.8
10.2
mV/°F
Slope)
10
10
TA = 77°F
Tested Limit
–2.5
2.5
–2.5
2.5
0
≤ IL ≤ 1 mA
Design Limit
mV/mA
±0.4
±0.4
Load regulation(5)
Tested Limit
TMIN ≤ TA ≤ 150°F
Design Limit
–6.0
6
–6
6
mV/mA
0
≤ IL ≤ 1 mA
±0.5
±0.5
Tested Limit
–0.1
0.1
–0.1
0.1
TA = 77°F,
Design Limit
mV/V
5 V
≤ VS ≤ 30 V
±0.01
±0.01
Line regulation(5)
Tested Limit
5 V
≤ VS ≤ 30 V
Design Limit
–0.2
0.2
–0.2
0.2
mV/V
±0.02
±0.02
(1)
Accuracy is defined as the error between the output voltage and 10 mV/
˚F times the device’s case temperature at specified conditions of
voltage, current, and temperature (expressed in
˚F).
(2)
Tested limits are specified and 100% tested in production.
(3)
Design limits are specified (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are
not used to calculate outgoing quality levels.
(4)
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the rated
temperature range of the device.
(5)
Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating
effects can be computed by multiplying the internal dissipation by the thermal resistance.
Copyright © 2000–2016, Texas Instruments Incorporated
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