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LM34DH Arkusz danych(PDF) 7 Page - Texas Instruments |
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LM34DH Arkusz danych(HTML) 7 Page - Texas Instruments |
7 / 27 page LM34 www.ti.com SNIS161D – MARCH 2000 – REVISED JANUARY 2016 6.6 Electrical Characteristics: LM34, LM34C, and LM34D Unless otherwise noted, these specifications apply: −50°F ≤ TJ ≤ 300°F for the LM34 and LM34A; −40°F ≤ TJ ≤ 230°F for the LM34C and LM34CA; and +32°F ≤ TJ ≤ 212°F for the LM34D. VS = 5 Vdc and ILOAD = 50 µA in the circuit of Full-Range Fahrenheit Temperature Sensor; 6 Vdc for LM34 and LM34A for 230°F ≤ TJ ≤ 300°F. These specifications also apply from 5°F to TMAX in the circuit of Basic Fahrenheit Temperature Sensor (5°F to 300°F). LM34 LM34C, LM34D PARAMETER CONDITIONS UNIT MIN TYP MAX MIN TYP MAX Tested Limit(2) –2 2 –2 2 TA = 77°F Design Limit(3) °F ±0.8 ±0.8 Tested Limit TA = 0°F Design Limit –3 3 °F ±1 ±1 Accuracy, LM34, LM34C(1) Tested Limit –3 3 TA = TMAX Design Limit –3 3 °F ±1.6 ±1.6 Tested Limit TA = TMIN Design Limit –3 3 –4 4 °F ±1.6 ±1.6 Tested Limit –3 3 TA = 77°F Design Limit °F ±1.2 Tested Limit Accuracy, LM34D(1) TA = TMAX Design Limit –4 4 °F ±1.8 Tested Limit TA = TMIN Design Limit –4 4 °F ±1.8 Tested Limit Nonlinearity (4) Design Limit –1.0 1 –1 1 °F ±0.6 ±0.4 Tested Limit 9.8 10.2 Sensor gain (Average Design Limit 9.8 10.2 mV/°F Slope) 10 10 TA = 77°F Tested Limit –2.5 2.5 –2.5 2.5 0 ≤ IL ≤ 1 mA Design Limit mV/mA ±0.4 ±0.4 Load regulation(5) Tested Limit TMIN ≤ TA ≤ 150°F Design Limit –6.0 6 –6 6 mV/mA 0 ≤ IL ≤ 1 mA ±0.5 ±0.5 Tested Limit –0.1 0.1 –0.1 0.1 TA = 77°F, Design Limit mV/V 5 V ≤ VS ≤ 30 V ±0.01 ±0.01 Line regulation(5) Tested Limit 5 V ≤ VS ≤ 30 V Design Limit –0.2 0.2 –0.2 0.2 mV/V ±0.02 ±0.02 (1) Accuracy is defined as the error between the output voltage and 10 mV/ ˚F times the device’s case temperature at specified conditions of voltage, current, and temperature (expressed in ˚F). (2) Tested limits are specified and 100% tested in production. (3) Design limits are specified (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (4) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the rated temperature range of the device. (5) Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. Copyright © 2000–2016, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: LM34 |
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