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LM3429-Q1 Arkusz danych(PDF) 5 Page - Texas Instruments |
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LM3429-Q1 Arkusz danych(HTML) 5 Page - Texas Instruments |
5 / 62 page LM3429, LM3429-Q1 www.ti.com SNVS616H – APRIL 2009 – REVISED JULY 2015 6.4 Thermal Information LM3429-Q1 LM3429 THERMAL METRIC(1) PWP (HTSSOP) PWP (HTSSOP) UNIT 14 PINS 14 PINS RθJA Junction-to-ambient thermal resistance 47.8 47.8 °C/W RθJC(top) Junction-to-case (top) thermal resistance 26.5 26.5 °C/W RθJB Junction-to-board thermal resistance 22.3 22.3 °C/W ψJT Junction-to-top characterization parameter 0.7 0.7 °C/W ψJB Junction-to-board characterization parameter 22.1 22.1 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 3.3 3.3 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. 6.5 Electrical Characteristics MIN and MAX limits apply TJ = (−40°C to 125°C) unless specified otherwise. Unless otherwise stated the following condition applies: VIN = 14 V. PARAMETER TEST CONDITIONS MIN(1) TYP(2) MAX(1) UNIT STARTUP REGULATOR (VCC) VCC-REG VCC Regulation ICC = 0 mA 6.3 6.9 7.35 V ICC-LIM VCC Current Limit VCC = 0V 20 27 mA IQ Quiescent Current Static 1.6 3 VCC-UVLO VCC UVLO Threshold VCC Increasing 4.17 4.5 VCC Decreasing 3.7 4.08 V VCC-HYS VCC UVLO Hysteresis 0.1 OVERVOLTAGE PROTECTION (OVP) VTH-OVP OVP OVLO Threshold OVP Increasing 1.18 1.24 1.28 V IHYS-OVP OVP Hysteresis Source Current OVP Active (high) 10 20 30 µA ERROR AMPLIFIER VCSH CSH Reference Voltage With Respect to AGND 1.21 1.235 1.26 V Error Amplifier Input Bias Current MIN, MAX: TJ = 25°C –0.6 0 0.6 µA COMP Sink / Source Current 10 26 40 Transconductance 100 µA/V Linear Input Range (3) ±125 mV Transconductance Bandwidth -6dB Unloaded Response(3), MIN: TJ = 0.5 1 MHz 25°C OFF TIMER (RCT) tOFF-MIN Minimum Off-time RCT = 1V through 1 k Ω 35 75 ns RRCT RCT Reset Pulldown Resistance 36 120 Ω VRCT VIN/25 Reference Voltage VIN = 14V 540 565 585 mV PWM COMPARATOR COMP to PWM Offset 700 800 900 mV CURRENT LIMIT (IS) VLIM Current Limit Threshold 215 245 275 mV VLIM Delay to Output 35 75 ns tON-MIN Leading Edge Blanking Time 75 250 450 (1) All limits specified at room temperature (TYP) and at temperature extremes (MIN/MAX). All room temperature limits are 100% production tested. All limits at temperature extremes are specified through correlation using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL). (2) Typical numbers are at 25°C and represent the most likely norm. (3) These electrical parameters are specified by design, and are not verified by test. Copyright © 2009–2015, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LM3429 LM3429-Q1 |
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