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SN74LVC1G38DRY2 Arkusz danych(PDF) 1 Page - Texas Instruments |
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SN74LVC1G38DRY2 Arkusz danych(HTML) 1 Page - Texas Instruments |
1 / 21 page 3 2 4 5 1 A VCC Y B GND DBV PACKAGE (TOP VIEW) YEP OR YZP PACKAGE (BOTTOM VIEW) DCK PACKAGE (TOP VIEW) 3 2 4 5 1 A VCC Y B GND A GND VCC Y B See mechanical drawings for dimensions. 1 4 2 3 5 DRY PACKAGE (TOP VIEW) B NC A 6 5 4 2 3 GND Y V CC 1 6 5 4 2 3 1 DSF PACKAGE (TOP VIEW) B A GND NC Y V CC NC – No internal connection SN74LVC1G38 www.ti.com SCES538D – JANUARY 2004 – REVISED DECEMBER 2013 Single 2-Input NAND Gate With Open-Drain Output Check for Samples: SN74LVC1G38 1 FEATURES DESCRIPTION The SN74LVC1G38 device is designed for 1.65-V to 2 • Available in the Texas Instruments NanoStar™ 5.5-V VCC operation. and NanoFree™ Packages This device is a single two-input NAND buffer gate • Supports 5-V VCC Operation with open-drain output. It performs the Boolean • Inputs Accept Voltages to 5.5 V function Y = A • B or Y = A + B in positive logic. • Supports Down Translation to VCC This device is fully specified for partial-power-down • Max tpd of 4.5 ns at 3.3 V applications using Ioff. The Ioff circuitry disables the • Low Power Consumption, 10-µA Max ICC outputs, preventing damaging current backflow through the device when it is powered down. • ±24-mA Output Drive at 3.3 V • Ioff Supports Live Insertion, Partial-Power- NanoStar™ and NanoFree™ package technology is Down Mode, and Back-Drive Protection a major breakthrough in IC packaging concepts, using the die as the package. • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 NanoStar, NanoFree are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Copyright © 2004–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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