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FCD4B14CCB Arkusz danych(PDF) 5 Page - ATMEL Corporation |
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FCD4B14CCB Arkusz danych(HTML) 5 Page - ATMEL Corporation |
5 / 20 page 5 FCD4B14 1962C–01/02 Table 5. Resistance Parameter Min Value Standard Method ESD On pins. HBM (Human Body Model) CMOS I/O 2 kV MIL-STD-883- method 3015.7 On die surface (Zapgun) Air discharge ±16 kV NF EN 6100-4-2 MECHANICAL ABRASION Number of cycles without lubricant multiply by a factor of 20 for correlation with a real finger 200 000 MIL E 12397B CHEMICAL RESISTANCE Cleaning agent, acid, grease, alcohol, diluted acetone 4 hours Internal method Table 6. Specifications Explanation Of Test Levels I 100% production tested at +25°C II 100% production tested at +25°C, and sample tested at specified temperatures (AC testing done on sample) III Sample tested only IV Parameter is guaranteed by design and/or characterization testing V Parameter is a typical value only VI 100% production tested at temperature extremes D 100% probe tested on wafer at T amb =+25°C Parameter Symbol Test Level Min Typ Max Unit Resolution IV 50 micron Size IV 8x280 pixel Yield: number of bad pixels I 15 bad pixels Equivalent resistance on TPP pin I 23 30 47 Ω |
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