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Zakładka z wyszukiwarką danych komponentów |
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ULN2004AIDR Arkusz danych(PDF) 5 Page - Texas Instruments |
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ULN2004AIDR Arkusz danych(HTML) 5 Page - Texas Instruments |
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5 / 17 page  ULN2004AI HIGHVOLTAGE HIGHCURRENT DARLINGTON TRANSISTOR ARRAY SLRS055 − APRIL 2004 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 PARAMETER MEASUREMENT INFORMATION Open VCE Open ICEX Figure 1. ICEX Test Circuit Open VCE VI ICEX Figure 2. ICEX Test Circuit Open VCE IC II(off) Figure 3. II(off) Test Circuit Open Open II(on) VI Figure 4. II Test Circuit Open VCE IC II hFE = IC II NOTE: II is fixed for measuring VCE(sat), variable for measuring hFE. Figure 5. hFE, VCE(sat) Test Circuit Open VCE IC VI(on) Figure 6. VI(on) Test Circuit VR Open IR Figure 7. IR Test Circuit IF VF Open Figure 8. VF Test Circuit |
Podobny numer części - ULN2004AIDR |
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Podobny opis - ULN2004AIDR |
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