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TPD3S014 Arkusz danych(PDF) 10 Page - Texas Instruments |
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TPD3S014 Arkusz danych(HTML) 10 Page - Texas Instruments |
10 / 28 page VIN 0.1 µF 1 IOUT VOUT 150 µF RLOAD OUT IN Enable Signal EN D2 GND D1 Copyright © 2016, Texas Instruments Incorporated Time (ns) -25 0 25 50 75 100 125 150 175 -80 -70 -60 -50 -40 -30 -20 -10 0 10 20 D001 D1/D2 Pins 10 TPD3S014-Q1 SLVSDG5B – MARCH 2016 – REVISED APRIL 2016 www.ti.com Product Folder Links: TPD3S014-Q1 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated Typical Characteristics (continued) Figure 19. D1/D2 IEC 61000-4-2 –8-kV Contact 7 Parameter Measurement Information (1) During the short applied tests, 300 µF is used because of the use of an external supply. Figure 20. Test Circuit for System Operation |
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