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LM136AH-2.5RLQV Arkusz danych(PDF) 5 Page - Texas Instruments |
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LM136AH-2.5RLQV Arkusz danych(HTML) 5 Page - Texas Instruments |
5 / 17 page LM136A-2.5QML, LM136A-2.5QML-SP www.ti.com SNOSAM3E – JULY 2007 – REVISED APPRIL 2013 LM136A-2.5QML Electrical Characteristics DC Parameters (1) (2) The following conditions apply, unless otherwise specified. IR = 1mA Sub- Parameter Test Conditions Notes Min Max Unit groups IAdj Adjust Current VAdj = 0.7V -125 +125 µA 1, 2, 3 ΔVZ 6.0 mV 1 Delta Zener Voltage 0.4mA ≤ IZ ≤ 10 mA 10 mV 2, 3 2.46 2.51 V 1 5 5 VAdj = Open 2.44 2.54 V 2, 3 VZ Zener Voltage 2.39 2.49 V 1 VAdj = 0.7V 2.29 2.49 V 2, 3 VAdj = 1.9V 2.49 2.69 V 1, 2, 3 See(3) 0.6 Ω 1 ZRD Reverse Dynamic Impedance See(3) 1.0 Ω 2, 3 VStab Temperature Stability VZ = Adjusted to 2.490V 18 mV 2, 3 (1) Pre and post irradiation limits are identical to those listed under DC electrical characteristics. These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters are specified only for the conditions as specified in Mil-Std-883, Method 1019. (2) Low dose rate testing has been performed on a wafer-by-wafer basis, per test method 1019 condition D of MIL-STD-883, with no enhanced low dose rate sensitivity (ELDRS) effect. (3) Parameter tested go-no-go only. LM136A-2.5QML Electrical Characteristics DC Drift Parameters (1) (2) Delta calculations are performed on QMLV devices at Group B, Subgroup 5 only. Sub- Parameter Test Conditions Notes Min Max Unit groups VAdj = Open −10 +10 mV 1 VZ Zener Voltage VAdj = 0.7V −10 +10 mV 1 VAdj = 1.9V −10 +10 mV 1 (1) Pre and post irradiation limits are identical to those listed under DC electrical characteristics. These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters are specified only for the conditions as specified in Mil-Std-883, Method 1019. (2) Low dose rate testing has been performed on a wafer-by-wafer basis, per test method 1019 condition D of MIL-STD-883, with no enhanced low dose rate sensitivity (ELDRS) effect. Copyright © 2007–2013, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LM136A-2.5QML LM136A-2.5QML-SP |
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