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7WB3306 Arkusz danych(PDF) 3 Page - ON Semiconductor

Numer części 7WB3306
Szczegółowy opis  2-Bit Bus Switch
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Producent  ONSEMI [ON Semiconductor]
Strona internetowa  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

7WB3306 Arkusz danych(HTML) 3 Page - ON Semiconductor

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7WB3306
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3
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage
−0.5 to +7.0
V
VIN
Control Pin Input Voltage
−0.5 to +7.0
V
VI/O
Switch Input / Output Voltage
−0.5 to +7.0
V
IIK
Control Pin DC Input Diode Current
VIN < GND
−50
mA
IOK
Switch I/O Port DC Diode Current
VI/O < GND
−50
mA
IO
ON−State Switch Current
$128
mA
Continuous Current Through VCC or GND
$150
mA
ICC
DC Supply Current Per Supply Pin
$150
mA
IGND
DC Ground Current per Ground Pin
$150
mA
TSTG
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
260
°C
TJ
Junction Temperature Under Bias
150
°C
qJA
Thermal Resistance
UDFN8 (Note 1)
Micro8
TSSOP8
111
392
150
°C/W
PD
Power Dissipation in Still Air at 85
°C
UDFN8
Micro8
TSSOP8
1127
319
833
mW
MSL
Moisture Sensitivity
Level 1
FR
Flammability Rating Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
VESD
ESD Withstand Voltage (Note 2)
Human Body Model, all pins
Human Body Model, An/Bn to Ground
Human Body Model, An/Bn to VCC
> 1.5
> 4
> 4
kV
kV
kV
ILATCHUP
Latchup Performance Above VCC and Below GND at 125°C (Note 3)
$100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
2. Tested to EIA / JESD22−A114−A.
3. Tested to EIA / JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
Positive DC Supply Voltage
4.0
5.5
V
VIN
Control Pin Input Voltage
0
5.5
V
VI/O
Switch Input / Output Voltage
0
5.5
V
TA
Operating Free−Air Temperature
−55
+125
°C
Dt/DV
Input Transition Rise or Fall Rate
Control Input
Switch I/O
0
0
5
DC
nS/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.


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