MC74VHCT257A

http://onsemi.com

5

A, B or S

Figure 5. Switching Waveform

Figure 6. Switching Waveform

Figure 7. Test Circuit

GND

Y

50%

Figure 8. Test Circuit

INPUT

*Includes all probe and jig capacitance

OUTPUT

TEST POINT

1 k

W

CONNECT TO GND WHEN

DEVICE

UNDER

TEST

Figure 9. Input Equivalent Circuit

*Includes all probe and jig capacitance

TEST POINT

DEVICE

UNDER

TEST

OUTPUT

50%

GND

HIGH

IMPEDANCE

Y

Y

OE

HIGH

IMPEDANCE

ORDERING INFORMATION

Device

Package

MC74VHCT257ADG

SOIC−16

(Pb−Free)

48 Units / Rail

MC74VHCT257ADR2G

SOIC−16

(Pb−Free)

2500 Tape & Reel

MC74VHCT257ADTG

TSSOP−16

(Pb−Free)

96 Units / Rail

M74VHCT257ADTR2G

TSSOP−16

(Pb−Free)

2500 Tape & Reel

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging

Specifications Brochure, BRD8011/D.