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STF5N80K5 Arkusz danych(PDF) 8 Page - STMicroelectronics |
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STF5N80K5 Arkusz danych(HTML) 8 Page - STMicroelectronics |
8 / 13 page Test circuits STF5N80K5 8/13 DocID028509 Rev 3 3 Test circuits Figure 14: Test circuit for resistive load switching times Figure 15: Test circuit for gate charge behavior Figure 16: Test circuit for inductive load switching and diode recovery times Figure 17: Unclamped inductive load test circuit Figure 18: Unclamped inductive waveform Figure 19: Switching time waveform AM01469v10 47 kΩ 2.7 kΩ 1 kΩ I G = CONST 100 Ω D.U.T. + pulse width VGS 2200 μF VG VDD RL |
Podobny numer części - STF5N80K5 |
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Podobny opis - STF5N80K5 |
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