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MC74VHCT86A Arkusz danych(PDF) 3 Page - ON Semiconductor

Numer części MC74VHCT86A
Szczegółowy opis  Quad 2-Input XOR Gate / CMOS Logic Level Shifter
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Producent  ONSEMI [ON Semiconductor]
Strona internetowa  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC74VHCT86A Arkusz danych(HTML) 3 Page - ON Semiconductor

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MC74VHCT86A
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3
DC ELECTRICAL CHARACTERISTICS
VCC
TA = 25°C
TA ≤ 85°C
TA ≤ 125°C
Symbol
Parameter
Test Conditions
(V)
Min
Typ
Max
Min
Max
Min
Max
Unit
VIH
Minimum High−Level
Input Voltage
3.0
4.5
5.5
1.2
2.0
2.0
1.2
2.0
2.0
1.2
2.0
2.0
V
VIL
Maximum Low−Level
Input Voltage
3.0
4.5
5.5
0.53
0.8
0.8
0.53
0.8
0.8
0.53
0.8
0.8
V
VOH
Minimum High−Level
Output Voltage
VIN = VIH or VIL
VIN = VIH or VIL
IOH = −50μA
3.0
4.5
2.9
4.4
3.0
4.5
2.9
4.4
2.9
4.4
V
VIN = VIH or VIL
IOH = −4mA
IOH = −8mA
3.0
4.5
2.58
3.94
2.48
3.80
2.34
3.66
V
VOL
Maximum Low−Level
Output Voltage
VIN = VIH or VIL
VIN = VIH or VIL
IOL = 50μA
3.0
4.5
0.0
0.0
0.1
0.1
0.1
0.1
0.1
0.1
V
VIN = VIH or VIL
IOL = 4mA
IOL = 8mA
3.0
4.5
0.36
0.36
0.44
0.44
0.52
0.52
V
IIN
Maximum Input
Leakage Current
VIN = 5.5V or GND
0 to
5.5
±0.1
±1.0
±1.0
μA
ICC
Maximum Quiescent
Supply Current
VIN = VCC or GND
5.5
2.0
20
40
μA
ICCT
Quiescent Supply
Current
Input: VIN = 3.4V
5.5
1.35
1.50
1.65
mA
IOPD
Output Leakage
Current
VOUT = 5.5V
0.0
0.5
5.0
10
μA
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3.0ns)
Symbol
Parameter
Test Conditions
TA = 25°C
TA = − 40 to 85°C
Unit
Min
Typ
Max
Min
Max
tPLH,
tPHL
Propagation Delay,
A or B to Y
VCC = 3.3 ± 0.3V
CL = 15pF
CL = 50pF
7.0
9.5
11.0
14.5
1.0
1.0
13.0
16.5
ns
VCC = 5.0 ± 0.5V
CL = 15pF
CL = 50pF
4.8
6.3
6.8
8.8
1.0
1.0
8.0
10.0
Cin
Input Capacitance
4
10
10
pF
CPD
Power Dissipation Capacitance (Note 1)
Typical @ 25
°C, VCC = 5.0V
pF
18
1. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.
Average operating current can be obtained by the equation: ICC(OPR) = CPD  VCC  fin + ICC / 4 (per gate). CPD is used to determine the
no−load dynamic power consumption; PD = CPD  VCC2  fin + ICC  VCC.
3.0V
GND
50%
50% VCC
A or B
Y
tPHL
tPLH
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
Figure 1. Switching Waveforms
Figure 2. Test Circuit
VOH
VOL


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