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MC74VHCT86A Arkusz danych(PDF) 3 Page - ON Semiconductor |
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MC74VHCT86A Arkusz danych(HTML) 3 Page - ON Semiconductor |
3 / 6 page MC74VHCT86A http://onsemi.com 3 DC ELECTRICAL CHARACTERISTICS VCC TA = 25°C TA ≤ 85°C TA ≤ 125°C Symbol Parameter Test Conditions (V) Min Typ Max Min Max Min Max Unit VIH Minimum High−Level Input Voltage 3.0 4.5 5.5 1.2 2.0 2.0 1.2 2.0 2.0 1.2 2.0 2.0 V VIL Maximum Low−Level Input Voltage 3.0 4.5 5.5 0.53 0.8 0.8 0.53 0.8 0.8 0.53 0.8 0.8 V VOH Minimum High−Level Output Voltage VIN = VIH or VIL VIN = VIH or VIL IOH = −50μA 3.0 4.5 2.9 4.4 3.0 4.5 2.9 4.4 2.9 4.4 V VIN = VIH or VIL IOH = −4mA IOH = −8mA 3.0 4.5 2.58 3.94 2.48 3.80 2.34 3.66 V VOL Maximum Low−Level Output Voltage VIN = VIH or VIL VIN = VIH or VIL IOL = 50μA 3.0 4.5 0.0 0.0 0.1 0.1 0.1 0.1 0.1 0.1 V VIN = VIH or VIL IOL = 4mA IOL = 8mA 3.0 4.5 0.36 0.36 0.44 0.44 0.52 0.52 V IIN Maximum Input Leakage Current VIN = 5.5V or GND 0 to 5.5 ±0.1 ±1.0 ±1.0 μA ICC Maximum Quiescent Supply Current VIN = VCC or GND 5.5 2.0 20 40 μA ICCT Quiescent Supply Current Input: VIN = 3.4V 5.5 1.35 1.50 1.65 mA IOPD Output Leakage Current VOUT = 5.5V 0.0 0.5 5.0 10 μA Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3.0ns) Symbol Parameter Test Conditions TA = 25°C TA = − 40 to 85°C Unit Min Typ Max Min Max tPLH, tPHL Propagation Delay, A or B to Y VCC = 3.3 ± 0.3V CL = 15pF CL = 50pF 7.0 9.5 11.0 14.5 1.0 1.0 13.0 16.5 ns VCC = 5.0 ± 0.5V CL = 15pF CL = 50pF 4.8 6.3 6.8 8.8 1.0 1.0 8.0 10.0 Cin Input Capacitance 4 10 10 pF CPD Power Dissipation Capacitance (Note 1) Typical @ 25 °C, VCC = 5.0V pF 18 1. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC(OPR) = CPD VCC fin + ICC / 4 (per gate). CPD is used to determine the no−load dynamic power consumption; PD = CPD VCC2 fin + ICC VCC. 3.0V GND 50% 50% VCC A or B Y tPHL tPLH *Includes all probe and jig capacitance CL* TEST POINT DEVICE UNDER TEST OUTPUT Figure 1. Switching Waveforms Figure 2. Test Circuit VOH VOL |
Podobny numer części - MC74VHCT86A_14 |
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Podobny opis - MC74VHCT86A_14 |
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