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ADS8586SIPMR Arkusz danych(PDF) 9 Page - Texas Instruments |
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ADS8586SIPMR Arkusz danych(HTML) 9 Page - Texas Instruments |
9 / 63 page 9 ADS8588S, ADS8586S, ADS8584S www.ti.com SBAS642 – DECEMBER 2016 Product Folder Links: ADS8588S ADS8586S ADS8584S Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated (1) Test Levels: (A) Tested at final test. Overtemperature limits are set by characterization and simulation. (B) Limits set by characterization and simulation, across temperature range. (C) Typical value only for information, provided by design simulation. (2) Ideal input span, does not include gain or offset error. (3) LSB = least significant bit. (4) This parameter is the endpoint INL, not best-fit INL. (5) Gain error is calculated after adjusting for offset error, which implies that positive full scale error = negative full scale error = gain error ÷ 2. 7.5 Electrical Characteristics minimum and maximum specifications are at TA = –40°C to +125°C, AVDD = 4.75 V to 5.25 V; typical specifications are at TA = 25°C; AVDD = 5 V, DVDD = 3 V, VREF = 2.5 V (internal), and fSAMPLE = 200 kSPS (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT TEST LEVEL(1) ANALOG INPUTS Full-scale input span(2) (AIN_nP to AIN_nGND) RANGE pin = 1 –10 10 V A RANGE pin = 0 –5 5 A AIN_nP Operating input range, positive input RANGE pin = 1 –10 10 V A RANGE pin = 0 –5 5 A AIN_nGND Operating input range, negative input All input ranges –0.3 0 0.3 V B RIN Input impedance At TA = 25°C 0.85 1 1.15 MΩ B Input impedance drift All input ranges –25 ±7 25 ppm/°C B IIkg(in) Input leakage current With voltage at AIN_nP = VIN, all input ranges (VIN – 2) / RIN µA A SYSTEM PERFORMANCE Resolution 16 Bits A NMC No missing codes 16 Bits A DNL Differential nonlinearity All input ranges –0.5 ±0.35 0.5 LSB(3) A INL Integral nonlinearity(4) All input ranges –1.5 ±0.45 1.5 LSB A EG Gain error(5) All input ranges, external reference TA = -40°C to +85°C –64 ±4 64 LSB A TA = -40°C to +125°C –96 ±4 96 A All input ranges, internal reference ±4 A Gain error matching (channel-to-channel) Input range = ±10 V, external and internal reference 10 60 LSB A Input range = ±5 V, external and internal reference 12 60 A Gain error temperature drift All input ranges, external reference –14 ±6 14 ppm/°C B All input ranges, internal reference ±10 B EO Offset error Input range = ±10 V –1.8 ±0.15 1.8 mV B Input range = ±5 V –1.8 ±0.15 1.8 B Offset error matching (channel-to-channel) All input ranges 0.3 2.4 mV B Offset error temperature drift All input ranges –3 ±0.3 3 ppm/°C B SAMPLING DYNAMICS tACQ Acquisition time 1 µs A fS Maximum throughput rate per channel without latency All eight channels included 200 kSPS A |
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