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ADS8586SIPMR Arkusz danych(PDF) 9 Page - Texas Instruments

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Numer części ADS8586SIPMR
Szczegółowy opis  16-Bit, 200-kSPS, 8-, 6- and 4-Channel, Simultaneous-Sampling ADCs with Bipolar Inputs on a Single Supply
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Producent  TI1 [Texas Instruments]
Strona internetowa  http://www.ti.com
Logo TI1 - Texas Instruments

ADS8586SIPMR Arkusz danych(HTML) 9 Page - Texas Instruments

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ADS8588S, ADS8586S, ADS8584S
www.ti.com
SBAS642 – DECEMBER 2016
Product Folder Links: ADS8588S ADS8586S ADS8584S
Submit Documentation Feedback
Copyright © 2016, Texas Instruments Incorporated
(1)
Test Levels: (A) Tested at final test. Overtemperature limits are set by characterization and simulation. (B) Limits set by characterization
and simulation, across temperature range. (C) Typical value only for information, provided by design simulation.
(2)
Ideal input span, does not include gain or offset error.
(3)
LSB = least significant bit.
(4)
This parameter is the endpoint INL, not best-fit INL.
(5)
Gain error is calculated after adjusting for offset error, which implies that positive full scale error = negative full scale error = gain error ÷
2.
7.5 Electrical Characteristics
minimum and maximum specifications are at TA = –40°C to +125°C, AVDD = 4.75 V to 5.25 V; typical specifications are at TA
= 25°C; AVDD = 5 V, DVDD = 3 V, VREF = 2.5 V (internal), and fSAMPLE = 200 kSPS (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TEST
LEVEL(1)
ANALOG INPUTS
Full-scale input span(2)
(AIN_nP to AIN_nGND)
RANGE pin = 1
–10
10
V
A
RANGE pin = 0
–5
5
A
AIN_nP
Operating input range,
positive input
RANGE pin = 1
–10
10
V
A
RANGE pin = 0
–5
5
A
AIN_nGND
Operating input range,
negative input
All input ranges
–0.3
0
0.3
V
B
RIN
Input impedance
At TA = 25°C
0.85
1
1.15
B
Input impedance drift
All input ranges
–25
±7
25
ppm/°C
B
IIkg(in)
Input leakage current
With voltage at AIN_nP = VIN,
all input ranges
(VIN – 2) / RIN
µA
A
SYSTEM PERFORMANCE
Resolution
16
Bits
A
NMC
No missing codes
16
Bits
A
DNL
Differential nonlinearity
All input ranges
–0.5
±0.35
0.5
LSB(3)
A
INL
Integral nonlinearity(4)
All input ranges
–1.5
±0.45
1.5
LSB
A
EG
Gain error(5)
All input
ranges,
external
reference
TA = -40°C to
+85°C
–64
±4
64
LSB
A
TA = -40°C to
+125°C
–96
±4
96
A
All input ranges,
internal reference
±4
A
Gain error matching
(channel-to-channel)
Input range = ±10 V,
external and internal reference
10
60
LSB
A
Input range = ±5 V,
external and internal reference
12
60
A
Gain error temperature drift
All input ranges,
external reference
–14
±6
14
ppm/°C
B
All input ranges,
internal reference
±10
B
EO
Offset error
Input range = ±10 V
–1.8
±0.15
1.8
mV
B
Input range = ±5 V
–1.8
±0.15
1.8
B
Offset error matching
(channel-to-channel)
All input ranges
0.3
2.4
mV
B
Offset error temperature drift
All input ranges
–3
±0.3
3
ppm/°C
B
SAMPLING DYNAMICS
tACQ
Acquisition time
1
µs
A
fS
Maximum throughput rate per channel
without latency
All eight channels included
200
kSPS
A


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