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ISL3175E Arkusz danych(PDF) 8 Page - Intersil Corporation |
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ISL3175E Arkusz danych(HTML) 8 Page - Intersil Corporation |
8 / 19 page 8 FN6307.5 June 8, 2012 Receiver Disable from Output High tHZ RL = 1kΩ, CL = 15pF, SW = GND (Figure 6), (Note 13) ISL3170E-75E Full 5 12 20 ns ISL3176E-78E Full 4 7 15 ns Receiver Disable from Output Low tLZ RL = 1kΩ, CL = 15pF, SW = VCC (Figure 6), (Note 13) ISL3170E-75E Full 5 13 20 ns ISL3176E-78E Full 4 7 15 ns Time to Shutdown tSHDN (Notes 10, 13) Full 50 180 600 ns Receiver Enable from Shutdown to Output High tZH(SHDN) RL = 1kΩ, CL = 15pF, SW = GND (Figure 6), (Notes 10, 12, 13) Full - 240 500 ns Receiver Enable from Shutdown to Output Low tZL(SHDN) RL = 1kΩ, CL = 15pF, SW = VCC (Figure 6), (Notes 10, 12, 13) Full - 240 500 ns NOTES: 5. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless otherwise specified. 6. Supply current specification is valid for loaded drivers when DE = 0V. 7. Applies to peak current. See “Typical Performance Curves” starting on page 12 for more information. 8. When testing devices with the shutdown feature, keep RE = 0 to prevent the device from entering SHDN. 9. When testing devices with the shutdown feature, the RE signal high time must be short enough (typically <100ns) to prevent the device from entering SHDN. 10. Versions with a shutdown feature are put into shutdown by bringing RE high and DE low. If the inputs are in this state for less than 50ns, the parts are guaranteed not to enter shutdown. If the inputs are in this state for at least 600ns, the parts are guaranteed to have entered shutdown. See “Low Power Shutdown Mode” on page 12. 11. Keep RE = VCC, and set the DE signal low time >600ns to ensure that the device enters SHDN. 12. Set the RE signal high time >600ns to ensure that the device enters SHDN. 13. Does not apply to the ISL3171E, ISL3174E and ISL3177E. 14. ΔtSKEW is the magnitude of the difference in propagation delays of the specified terminals of two units tested with identical test conditions (VCC, temperature, etc.). Only applies to the ISL3176E through ISL3178E. 15. ISL3170E through ISL3175E only. 16. VCC ≥ 3.15V 17. Limits established by characterization and are not production tested. 18. If the Tx or Rx enable function isn’t needed, connect the enable pin to the appropriate supply (see “Pin Descriptions” on page 3) through a 1k Ω to 3k Ω resistor. 19. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization and are not production tested. 20. If the DE or RE input voltage exceeds the VCC voltage by more than 500mV, then current will flow into the logic pin. The current is limited by a 340Ω resistor (so ≈13mA with VIN = 5V and VCC = 0V) so no damage will occur if VCC ≤ VIN ≤ 7V for short periods of time. Test Circuits and Waveforms FIGURE 1A. VOD AND VOC FIGURE 1B. VOD WITH COMMON MODE LOAD FIGURE 1. DC DRIVER TEST CIRCUITS Electrical Specifications Test Conditions: VCC = 3.0V to 3.6V; Unless Otherwise Specified. Typicals are at VCC = 3.3V, TA = +25°C, (Note 5) PARAMETER SYMBOL TEST CONDITIONS TEMP (°C) MIN (Note 19) TYP MAX (Note 19) UNITS D DE DI VCC VOD VOC RL/2 RL/2 Z Y D DE DI VCC VOD 375 Ω 375 Ω Z Y RL = 60Ω VCM -7V to +12V ISL3170E, ISL3171E, ISL3172E, ISL3173E, ISL3174E, ISL3175E,ISL3176E, ISL3177E, ISL3178E |
Podobny numer części - ISL3175E |
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Podobny opis - ISL3175E |
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