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ADXL345-EP Datasheet(Arkusz danych) 4 Page - Analog Devices

Numer części ADXL345-EP
Szczegółowy opis  ADXL345-EP
Pobierz  12 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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ADXL345-EP
Enhanced Product
Rev. B | Page 4 of 12
Parameter
Test Conditions
Min
Typ1
Max
Unit
TEMPERATURE
Operating Temperature Range
−55
+105
°C
WEIGHT
Device Weight
30
mg
1
The typical specifications shown are for at least 68% of the population of parts and are based on the worst case of mean ±1 σ, except for 0 g output and sensitivity,
which represents the target value. For 0 g output and sensitivity, the deviation from the ideal describes the worst case of mean ±1 σ.
2
Cross-axis sensitivity is defined as coupling between any two axes.
3
Bandwidth is the −3 dB frequency and is defined as half the output data rate, bandwidth = ODR/2.
4
The output format for the 3200 Hz and 1600 Hz ODRs is different from the output format for the remaining ODRs. This difference is described in the ADXL345 data
sheet.
5
Output data rates below 6.25 Hz exhibit additional offset shift with increased temperature, depending on selected output data rate. Refer to the ADXL345 data sheet
for details.
6
Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST
bit = 0. Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). The part must be in normal
power operation (LOW_POWER bit = 0 in the BW_RATE register, Address 0x2C) for self-test to operate correctly.
7
Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).




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