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ADT7519ARQZ1-REEL Arkusz danych(PDF) 11 Page - Analog Devices |
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ADT7519ARQZ1-REEL Arkusz danych(HTML) 11 Page - Analog Devices |
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11 / 44 page  ADT7516/ADT7517/ADT7519 Rev. A | Page 11 of 44 TERMINOLOGY Relative Accuracy Relative accuracy or integral nonlinearity (INL) is a measure of the maximum deviation, in LSBs, from a straight line passing through the endpoints of the transfer function. Typical INL versus code plots can be seen in Figure 10, Figure 11, and Figure 12. Differential Nonlinearity Differential nonlinearity (DNL) is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±0.9 LSB maximum ensures monotonicity. Typical DAC DNL versus code plots can be seen in Figure 13, Figure 14, and Figure 15. Total Unadjusted Error (TUE) Total unadjusted error is a comprehensive specification that includes the sum of the relative accuracy error, gain error, and offset error under a specified set of conditions. Offset Error This is a measure of the offset error of the DAC and the output amplifier (See Figure 8 and Figure 9). It can be negative or positive, and it is expressed in mV. Offset Error Match This is the difference in offset error between any two channels. Gain Error This is a measure of the span error of the DAC. It is the deviation in slope of the actual DAC transfer characteristic from the ideal expressed as a percentage of the full-scale range. Gain Error Match This is the difference in gain error between any two channels. Offset Error Drift This is a measure of the change in offset error with changes in temperature. It is expressed in (ppm of full-scale range)/°C. Gain Error Drift This is a measure of the change in gain error with changes in temperature. It is expressed in (ppm of full-scale range)/°C. Long Term Temperature Drift This is a measure of the change in temperature error with the passage of time. It is expressed in °C. The concept of long-term stability has been used for many years to describe the amount an IC’s parameter would shift during its lifetime. This is a concept that has typically been applied to both voltage references and monolithic temperature sensors. Unfortunately, integrated circuits cannot be evaluated at room temperature (25°C) for 10 years or so to determine this shift. Manufacturers perform accelerated lifetime testing of integrated circuits by operating ICs at elevated temperatures (between 125°C and 150°C) over a shorter period (typically between 500 and 1000 hours). As a result, the lifetime of an integrated circuit is significantly accelerated due to the increase in rates of reaction within the semiconductor material. DC Power Supply Rejection Ratio (PSRR) This indicates how the output of the DAC is affected by changes in the supply voltage. PSRR is the ratio of the change in VOUT to a change in VDD for full-scale output of the DAC. It is measured in dB. VREF is held at 2 V and VDD is varied ±10%. DC Crosstalk This is the dc change in the output level of one DAC in response to a change in the output of another DAC. It is measured with a full-scale output change on one DAC while monitoring another DAC. It is expressed in µV. Reference Feedthrough This is the ratio of the amplitude of the signal at the DAC output to the reference input when the DAC output is not being updated (i.e., LDAC is high). It is expressed in dB. Channel-to-Channel Isolation This is the ratio of the amplitude of the signal at the output of one DAC to a sine wave on the reference input of another DAC. It is measured in dB. Major-Code Transition Glitch Energy Major-code transition glitch energy is the energy of the impulse injected into the analog output when the code in the DAC register changes state. It is normally specified as the area of the glitch in nV-s and is measured when the digital code is changed by 1 LSB at the major carry transition (011 . . . 11 to 100 . . . 00 or 100 . . . 00 to 011 . . . 11). Digital Feedthrough Digital feedthrough is a measure of the impulse injected into the analog output of a DAC from the digital input pins of the device but is measured when the DAC is not being written to. It is specified in nV-s and is measured with a full-scale change on the digital input pins, i.e., from all 0s to all 1s or vice versa. Digital Crosstalk This is the glitch impulse transferred to the output of one DAC at midscale in response to a full-scale code change (all 0s to all 1s and vice versa) in the input register of another DAC. It is measured in standalone mode and is expressed in nV-s. Analog Crosstalk This is the glitch impulse transferred to the output of one DAC due to a change in the output of another DAC. It is measured by loading one of the input registers with a full-scale code change (all 0s to all 1s and vice versa) while keeping LDAC high. Then pulse LDAC low and monitor the output of the DAC whose digital code was not changed. The area of the glitch is expressed in nV-s. |
Podobny numer części - ADT7519ARQZ1-REEL |
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Podobny opis - ADT7519ARQZ1-REEL |
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