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ADS1222IPWR Arkusz danych(PDF) 2 Page - Burr-Brown (TI)

[Old version datasheet] Texas Instruments acquired Burr-Brown Corporation. Click here to check the latest version.
Numer części ADS1222IPWR
Szczegółowy opis  24 BIT ANALOG TO DIGITAL CONVERTER WITH 2-CHANNEL DIFFERENTIAL INPUT MULTIPLEXER
Download  21 Pages
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Producent  BURR-BROWN [Burr-Brown (TI)]
Strona internetowa  http://www.burr-brown.com
Logo BURR-BROWN - Burr-Brown (TI)

ADS1222IPWR Arkusz danych(HTML) 2 Page - Burr-Brown (TI)

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ADS1222
SBAS314A − APRIL 2004 − REVISED SEPTEMBER 2004
www.ti.com
2
ORDERING INFORMATION
PRODUCT
PACKAGE-LEAD
PACKAGE
DESIGNATOR(1)
PACKAGE
MARKING
ORDERING NUMBER
TRANSPORT MEDIA,
QUANTITY
ADS1222
TSSOP-14
PW
ADS1222
ADS1222IPWT
Tape and Reel, 250
ADS1222
TSSOP-14
PW
ADS1222
ADS1222IPWR
Tape and Reel, 2000
(1) For the most current specification and package information, refer to our web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
ADS1222
UNIT
VDD to GND
−0.3 to +6
V
Input current
100, momentary
mA
Input current
10, continuous
mA
Analog input voltage to GND
−0.3 to VDD + 0.3
V
Digital input voltage to GND
−0.3 to VDD + 0.3
V
Maximum Junction Temperature
+150
°C
Operating Temperature Range
−55 to +125
°C
Storage Temperature Range
−60 to +150
°C
Lead Temperature (soldering, 10s)
+300
°C
(1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods
may degrade device reliability. These are stress ratings only, and
functional operation of the device at these or any other conditions
beyond those specified is not implied.
This integrated circuit can be damaged by ESD. Texas
Instruments recommends that all integrated circuits be
handled with appropriate precautions. Failure to observe
proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to
complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.


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