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DAC0808LCN Arkusz danych(PDF) 6 Page - National Semiconductor (TI) |
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DAC0808LCN Arkusz danych(HTML) 6 Page - National Semiconductor (TI) |
6 / 10 page Test Circuits TLH5687 6 VI and I1 apply to inputs A1–A8 The resistor tied to pin 15 is to temperature compensate the bias current and may not be necessary for all applications IO K A12aA24aA38aA416aA532aA664a A7128a A8256J where K j VREF R14 and AN ‘‘1’’ if AN is at high level AN ‘‘0’’ if AN is at low level FIGURE 3 Notation Definitions Test Circuit (Note 7) TLH5687 7 FIGURE 4 Relative Accuracy Test Circuit (Note 7) TLH5687 8 FIGURE 5 Transient Response and Settling Time (Note 7) 6 |
Podobny numer części - DAC0808LCN |
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Podobny opis - DAC0808LCN |
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