GS82582Q38GE-500 datasheet(11/25 Pages) GSI

Numer części	GS82582Q38GE-500

Szczegółowy opis	Byte Write controls sampled at data-in time

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Producent	GSI [GSI Technology]

Strona internetowa	http://www.gsitechnology.com

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Capacitance

oC, f = 1 MHZ, VDD = 1.8 V)

Parameter

Symbol

Test conditions

Typ.

Max.

Unit

Input Capacitance

CIN

VIN = 0 V

4

5

pF

Output Capacitance

COUT

VOUT = 0 V

6

7

pF

Clock Capacitance

CCLK

VIN = 0 V

5

6

pF

Note:

This parameter is sample tested.

AC Test Conditions

Parameter

Conditions

Input high level

1.25

Input low level

0.25 V

Max. input slew rate

2 V/ns

Input reference level

0.75

Output reference level

VDDQ/2

Note:

Test conditions as specified with output loading as shown unless otherwise noted.

GS82582Q20/38GE-500/450/400/375

Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.

Rev: 1.04 4/2016

11/25

DQ

VT == 0.75 V

50



RQ = 250

(HSTL I/O)

VREF = 0.75 V

AC Test Load Diagram

Input and Output Leakage Characteristics

Parameter

Symbol

Test Conditions

Min.

Max

Input Leakage Current

(except mode pins)

IIL

VIN = 0 to VDD

–2 uA

2 uA

Doff

IILDOFF

VIN = 0 to VDD

–20 uA

2 uA

ODT

IIL ODT

VIN = 0 to VDD

–2 uA

20 uA

Output Leakage Current

IOL

Output Disable,

VOUT = 0 to VDDQ

–2 uA

2 uA

(TA = 25

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GS82582Q38GE-500 Arkusz danych(PDF) 11 Page - GSI Technology

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