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Zakładka z wyszukiwarką danych komponentów |
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Zakładka z wyszukiwarką danych komponentów |
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FQP50N06 Arkusz danych(PDF) 5 Page - Thinki Semiconductor Co., Ltd. |
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FQP50N06 Arkusz danych(HTML) 5 Page - Thinki Semiconductor Co., Ltd. |
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5 / 6 page  Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms Charge V GS 10V Q g Q gs Q gd 3mA VGS DUT V DS 300nF 50KΩ 200nF 12V Same Type as DUT Charge V GS 10V Q g Q gs Q gd 3mA VGS DUT V DS 300nF 50KΩ 200nF 12V Same Type as DUT VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V V DS R L DUT RG VGS VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V V DS R L DUT RG VGS EAS =L IAS 2 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L I D t p EAS =L IAS 2 ---- 2 1 EAS =L IAS 2 ---- 2 1 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L L I D I D t p © 2006 Thinki Semiconductor Co., Ltd. http://www.thinkisemi.com/ Page 5/6 Rev.08C FQP50N06 |
Podobny numer części - FQP50N06_17 |
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Podobny opis - FQP50N06_17 |
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